Nanometre-scale electronics with III–V compound semiconductors

JA Del Alamo - Nature, 2011 - nature.com
For 50 years the exponential rise in the power of electronics has been fuelled by an increase
in the density of silicon complementary metal–oxide–semiconductor (CMOS) transistors and …

Crystallinity of inorganic films grown by atomic layer deposition: Overview and general trends

V Miikkulainen, M Leskelä, M Ritala… - Journal of Applied …, 2013 - pubs.aip.org
Atomic layer deposition (ALD) is gaining attention as a thin film deposition method, uniquely
suitable for depositing uniform and conformal films on complex three-dimensional …

Atomic layer deposition of metal oxides and chalcogenides for high performance transistors

C Shen, Z Yin, F Collins, N Pinna - Advanced Science, 2022 - Wiley Online Library
Atomic layer deposition (ALD) is a deposition technique well‐suited to produce high‐quality
thin film materials at the nanoscale for applications in transistors. This review …

Applications of atomic layer deposition to nanofabrication and emerging nanodevices

H Kim, WJ Maeng - Thin solid films, 2009 - Elsevier
Recently, with scaling down of semiconductor devices, need for nanotechnology has
increased enormously. For nanoscale devices especially, each of the layers should be as …

Band offsets of high K gate oxides on III-V semiconductors

J Robertson, B Falabretti - Journal of applied physics, 2006 - pubs.aip.org
III-V semiconductors have high mobility and will be used in field effect transistors with the
appropriate gate dielectric. The dielectrics must have band offsets over 1 eV to inhibit …

III–V compound semiconductor transistors—from planar to nanowire structures

H Riel, LE Wernersson, M Hong, JA Del Alamo - Mrs Bulletin, 2014 - cambridge.org
Conventional silicon transistor scaling is fast approaching its limits. An extension of the logic
device roadmap to further improve future performance increases of integrated circuits is …

GaAs interfacial self-cleaning by atomic layer deposition

CL Hinkle, AM Sonnet, EM Vogel, S McDonnell… - Applied Physics …, 2008 - pubs.aip.org
The reduction and removal of surface oxides from GaAs substrates by atomic layer
deposition (ALD) of Al 2 O 3 and Hf O 2 are studied using in situ monochromatic x-ray …

Surface passivation of III-V compound semiconductors using atomic-layer-deposition-grown Al2O3

ML Huang, YC Chang, CH Chang, YJ Lee… - Applied Physics …, 2005 - pubs.aip.org
Al 2 O 3 was deposited on In 0.15 Ga 0.85 As∕ GaAs using atomic-layer deposition (ALD).
Without any surface preparation or postthermal treatment, excellent electrical properties of Al …

Effect of forming gas annealing on the ferroelectric properties of Hf0. 5Zr0. 5O2 thin films with and without Pt electrodes

M Hyuk Park, H Joon Kim, Y Jin Kim, W Lee… - Applied Physics …, 2013 - pubs.aip.org
The effects of forming gas annealing (FGA) on the ferroelectric properties of Hf 0.5 Zr 0.5 O 2
(HZO) films were examined. Although the H-incorporation during FGA degrades the …

Modulating the Interface Quality and Electrical Properties of HfTiO/InGaAs Gate Stack by Atomic-Layer-Deposition-Derived Al2O3 Passivation Layer

G He, J Gao, H Chen, J Cui, Z Sun… - ACS applied materials & …, 2014 - ACS Publications
In current work, the effect of the growth cycles of atomic-layer-deposition (ALD) derived
ultrathin Al2O3 interfacial passivation layer on the interface chemistry and electrical …