Contactless measurements of carrier concentrations in InGaAs layers for utilizing in InP-based quantum cascade lasers by employing optical spectroscopy

M Kurka, M Rygała, G Sęk, P Gutowski, K Pierściński… - Materials, 2020 - mdpi.com
The precise determination of carrier concentration in doped semiconductor materials and
nanostructures is of high importance. Many parameters of an operational device are …