Integration of scheduling and advanced process control in semiconductor manufacturing: review and outlook

C Yugma, J Blue, S Dauzère-Pérès, A Obeid - Journal of Scheduling, 2015 - Springer
Scheduling in semiconductor manufacturing is of vital importance due to the impact on
production performance indicators such as equipment utilization, cycle time, and delivery …

A literature review on sampling techniques in semiconductor manufacturing

J Nduhura-Munga, G Rodriguez-Verjan… - IEEE Transactions …, 2013 - ieeexplore.ieee.org
This paper reviews sampling techniques for inspection in semiconductor manufacturing. We
discuss the strengths and weaknesses of techniques developed in the last last 20 years for …

Bayesian decision analysis for optimizing in-line metrology and defect inspection strategy for sustainable semiconductor manufacturing and an empirical study

CF Chien, TH Van Nguyen, YC Li, YJ Chen - Computers & Industrial …, 2023 - Elsevier
In-line metrology for defect inspection is employed for quality control and calibration of data-
driven models for intelligent manufacturing. However, defect inspection is time-consuming …

Quality control planning to prevent excessive scrap production

B Bettayeb, SJ Bassetto, M Sahnoun - Journal of Manufacturing Systems, 2014 - Elsevier
This paper presents a risk-based approach for quality control planning of complex discrete
manufacturing processes, to prevent massive scraps to occur. An analytical model is …

Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing

M Sahnoun, B Bettayeb, SJ Bassetto… - Journal of Intelligent …, 2016 - Springer
Semiconductor manufacturing processes are very long and complex, needing several
hundreds of individual steps to produce the final product (chip). In this context, the early …

Feasibility evaluation of virtual metrology for the example of a trench etch process

G Roeder, S Winzer, M Schellenberger… - IEEE Transactions …, 2014 - ieeexplore.ieee.org
In semiconductor manufacturing, the implementation of advanced process control systems
has become essential for cost effective manufacturing at high product quality. In addition to …

Quality and exposure control in semiconductor manufacturing. Part I: Modelling

B Bettayeb, S Bassetto, P Vialletelle… - International Journal of …, 2012 - Taylor & Francis
The purpose of this paper is to present a heuristic algorithm for quality control planning from
an insurance perspective. The approach proposed here is designed to judiciously allocate …

Dynamic management of controls in semiconductor manufacturing

JN Munga, S Dauzère-Pérès… - 2011 IEEE/SEMI …, 2011 - ieeexplore.ieee.org
In order to optimize the number of controls in semiconductor manufacturing, a Permanent
Index per Context (IPC) has been developed to evaluate in real-time the risk on production …

A dynamic sampling methodology for plasma etch processes using Gaussian process regression

J Wan, B Honari, S McLoone - 2013 XXIV International …, 2013 - ieeexplore.ieee.org
Plasma etch is a key process in modern semiconductor manufacturing facilities as it offers
process simplification and yet greater dimensional tolerances compared to wet chemical …

Impact of control plan design on tool risk management: A simulation study in semiconductor manufacturing

GLR Verjan, S Dauzère-Pérès… - Proceedings of the 2011 …, 2011 - ieeexplore.ieee.org
In this paper, we analyze the impact of control plan design of defectivity inspections for tool
risk management. Defectivity inspections are performed on products and can reveal the …