Recent trends of aggressive technology scaling have greatly exacerbated the occurrences
and impact of faults in computing systems. This has madereliability'a first-order design …

Errors in dynamic random access memory (DRAM) are a common form of hardware failure
in modern compute clusters. Failures are costly both in terms of hardware replacement costs …

To improve performance and reduce power, processor designers employ advances that
shrink feature sizes, lower voltage levels, reduce noise margins, and increase clock rates …

Computing systems use dynamic random-access memory (DRAM) as main memory. As
prior works have shown, failures in DRAM devices are an important source of errors in …

Most modern computer systems use dynamic random access memory (DRAM) as a main
memory store. Recent publications have confirmed that DRAM errors are a common source …

Architecture Design for Soft Errors provides a comprehensive description of the architectural
techniques to tackle the soft error problem. It covers the new methodologies for quantitative …

Radiation-induced soft errors have emerged as a key challenge in computer system design.
If the industry is to continue to provide customers with the level of reliability they expect …

Transient faults due to neutron and alpha particle strikes posea significant obstacle to
increasing processor transistor counts infuture technologies. Although fault rates of …

As the size of the SRAM cache and DRAM memory grows in servers and workstations,
cosmic-ray errors are becoming a major concern for systems designers and end users …

The significance of multiple cell upsets (MCUs) is revealed by sharing the soft-error test
results in three major technologies, 90 nm, 65 nm, and 45 nm. The effectiveness of single-bit …