Emerging GaN technologies for power, RF, digital, and quantum computing applications: Recent advances and prospects

K Hoo Teo, Y Zhang, N Chowdhury… - Journal of Applied …, 2021 - pubs.aip.org
GaN technology is not only gaining traction in power and RF electronics but is also rapidly
expanding into other application areas including digital and quantum computing electronics …

[HTML][HTML] A review on the GaN-on-Si power electronic devices

Y Zhong, J Zhang, S Wu, L Jia, X Yang, Y Liu… - Fundamental …, 2022 - Elsevier
The past decades have witnessed a tremendous development of GaN-based power
electronic devices grown on Si substrate. This article provides a concise introduction …

GaN-based power devices: Physics, reliability, and perspectives

M Meneghini, C De Santi, I Abid, M Buffolo… - Journal of Applied …, 2021 - pubs.aip.org
Over the last decade, gallium nitride (GaN) has emerged as an excellent material for the
fabrication of power devices. Among the semiconductors for which power devices are …

Gallium nitride vertical power devices on foreign substrates: a review and outlook

Y Zhang, A Dadgar, T Palacios - Journal of Physics D: Applied …, 2018 - iopscience.iop.org
Vertical gallium nitride (GaN) power devices have attracted increased attention due to their
superior high-voltage and high-current capacity as well as easier thermal management than …

GaN FinFETs and trigate devices for power and RF applications: Review and perspective

Y Zhang, A Zubair, Z Liu, M Xiao… - Semiconductor …, 2021 - iopscience.iop.org
Gallium nitride (GaN) is becoming a mainstream semiconductor for power and radio-
frequency (RF) applications. While commercial GaN devices are increasingly being adopted …

Correlation between dislocations and leakage current of pn diodes on a free-standing GaN substrate

S Usami, Y Ando, A Tanaka, K Nagamatsu… - Applied Physics …, 2018 - pubs.aip.org
Dislocations that cause a reverse leakage current in vertical pn diodes on a GaN free-
standing substrate were investigated. Under a high reverse bias, dot-like leakage spots …

A strategic review on gallium oxide based power electronics: Recent progress and future prospects

D Kaur, A Ghosh, M Kumar - Materials Today Communications, 2022 - Elsevier
Silicon based power devices have limited capabilities in terms of voltage handling and
switching speeds, leading to rampant research in the field of next generation wide bandgap …

Surge-energy and overvoltage ruggedness of P-gate GaN HEMTs

R Zhang, JP Kozak, M Xiao, J Liu… - IEEE Transactions on …, 2020 - ieeexplore.ieee.org
An essential ruggedness of power devices is the capability of safely withstanding the surge
energy. The surge ruggedness of the GaN high-electron-mobility transistor (HEMT), a power …

Vertical GaN junction barrier Schottky rectifiers by selective ion implantation

Y Zhang, Z Liu, MJ Tadjer, M Sun… - IEEE Electron …, 2017 - ieeexplore.ieee.org
This letter demonstrates vertical GaN junction barrier Schottky (JBS) rectifiers fabricated with
novel ion implantation techniques. We used two different methods to form the lateral pn grids …

Materials and processing issues in vertical GaN power electronics

J Hu, Y Zhang, M Sun, D Piedra, N Chowdhury… - Materials Science in …, 2018 - Elsevier
Silicon-based power devices are reaching their fundamental performance limit. The use of
wide-bandgap semiconductors with superior material properties over silicon offers the …