Stability diagram of unilateral buckling patterns of strip-delaminated films

G Parry, A Cimetière, C Coupeau, J Colin… - Physical Review E …, 2006 - APS
Thin films deposited on substrates are usually submitted to large residual compression
stresses, causing delamination and buckling of the film into various patterns. The present …

Atomic force microscopy of in situ deformed nickel thin films

C Coupeau, JF Naud, F Cleymand, P Goudeau… - Thin Solid Films, 1999 - Elsevier
The mechanical behaviour of thin metal films on substrate under stress and particularly the
analysis of the first stage of buckling have been characterized. Nickel/polycarbonate …

Damage mode tensile testing of thin gold films on polyimide substrates by X-ray diffraction and atomic force microscopy

PO Renault, P Villain, C Coupeau, P Goudeau… - Thin Solid Films, 2003 - Elsevier
In situ tensile testing has been performed on thin gold film, 320 nm thick, deposited on
polyimide substrates. During the tensile testing, strain/stress measurements have been …

Buckling and post-buckling of stressed straight-sided wrinkles: experimental AFM observations of bubbles formation and finite element simulations

G Parry, C Coupeau, J Colin, A Cimetière, J Grilhé - Acta materialia, 2004 - Elsevier
The transition from a straight-sided wrinkle to a periodic distribution of bubbles has been
experimentally studied by atomic force microscopy for a stressed thin film relying on a …

Interacting straight-sided buckles: an enhanced attraction by substrate elasticity

C Coupeau, R Boijoux, Y Ni, G Parry - … of the Mechanics and Physics of …, 2019 - Elsevier
Interaction between two straight-sided buckles propagating in opposite directions has been
investigated by atomic force microscopy. Below a critical separation distance, it is observed …

An experimental UHV AFM-STM device for characterizing surface nanostructures under stress/strain at variable temperature

Y Nahas, F Berneau, J Bonneville… - Review of Scientific …, 2013 - pubs.aip.org
A compression setup fully integrated in an ultra high vacuum chamber is presented. The
system has been designed to combine in situ mechanical test together with near field …

Combination of universal mechanical testing machine with atomic force microscope for materials research

J Zhong, D He - Scientific Reports, 2015 - nature.com
Surface deformation and fracture processes of materials under external force are important
for understanding and developing materials. Here, a combined horizontal universal …

Atypical “boomerang” slip traces in [0 0 1] niobium single crystals deformed at room temperature

DSH Charrier, J Bonneville, C Coupeau, Y Nahas - Scripta Materialia, 2012 - Elsevier
Niobium single crystals were deformed in compression at room temperature using an
homemade device that allows in situ tracking by atomic force microscopy of the surface …

Quantitative atomic force microscopy analysis of slip traces in Ni3Al yield stress anomaly

J Bonneville, C Coupeau - Materials Science and Engineering: A, 2008 - Elsevier
It is well known that Ni3Al intermetallic compounds of the L12 ordered structure exhibit
positive temperature dependence of yield stress over a finite temperature range. In this work …

An atomic resolution scanning tunneling microscope that applies external tensile stress and strain in an ultrahigh vacuum

D Fujita, M Kitahara, K Onishi, K Sagisaka - Nanotechnology, 2007 - iopscience.iop.org
We have developed an ultrahigh vacuum scanning tunneling microscope with an in situ
external stress application capability in order to determine the effects of stress and strain on …