Recent developments in materials, architectures and processing of AlGaN/GaN HEMTs for future RF and power electronic applications: A critical review

B Mounika, J Ajayan, S Bhattacharya, D Nirmal - Micro and Nanostructures, 2022 - Elsevier
This article critically reviews the architectural novelties, emerging materials (substrate,
buffer, barrier & contact materials), technological advancements, processing techniques …

A review of thermoreflectance techniques for characterizing wide bandgap semiconductors' thermal properties and devices' temperatures

C Yuan, R Hanus, S Graham - Journal of Applied Physics, 2022 - pubs.aip.org
Thermoreflectance-based techniques, such as pump–probe thermoreflectance (pump–
probe TR) and thermoreflectance thermal imaging (TTI), have emerged as the powerful and …

[HTML][HTML] Nanoscale electro-thermal interactions in AlGaN/GaN high electron mobility transistors

B Chatterjee, C Dundar, TE Beechem… - Journal of Applied …, 2020 - pubs.aip.org
Self-heating in AlGaN/GaN high electron mobility transistors (HEMTs) negatively impacts
device performance and reliability. Under nominal operating conditions, a hot-spot in the …

Characterization and modeling of self-heating in nanometer bulk-CMOS at cryogenic temperatures

PAT Hart, M Babaie, A Vladimirescu… - IEEE Journal of the …, 2021 - ieeexplore.ieee.org
This work presents a self-heating study of a 40-nm bulk-CMOS technology in the ambient
temperature range from 300 K down to 4.2 K. A custom test chip was designed and …

[HTML][HTML] CMOS on-chip thermometry at deep cryogenic temperatures

GM Noah, TH Swift, M De Kruijf, A Gomez-Saiz… - Applied Physics …, 2024 - pubs.aip.org
Accurate on-chip temperature sensing is critical for the optimal performance of modern
complementary metal-oxide-semiconductor (CMOS) integrated circuits (ICs), to understand …

[HTML][HTML] Simultaneous measurement of temperature, stress, and electric field in GaN HEMTs with micro-Raman spectroscopy

KR Bagnall, EA Moore, SC Badescu, L Zhang… - Review of Scientific …, 2017 - pubs.aip.org
As semiconductor devices based on silicon reach their intrinsic material limits, compound
semiconductors, such as gallium nitride (GaN), are gaining increasing interest for high …

[HTML][HTML] A critical review on the junction temperature measurement of light emitting diodes

C Cengiz, M Azarifar, M Arik - Micromachines, 2022 - mdpi.com
In the new age of illumination, light emitting diodes (LEDs) have been proven to be the most
efficient alternative to conventional light sources. Yet, in comparison to other lighting …

[HTML][HTML] Thermal environment impact on HfOx RRAM operation: A nanoscale thermometry and modeling study

MP West, G Pavlidis, RH Montgomery… - Journal of Applied …, 2023 - pubs.aip.org
As the demand for computing applications capable of processing large datasets increases,
there is a growing need for new in-memory computing technologies. Oxide-based resistive …

High-resolution thermoreflectance imaging investigation of self-heating in AlGaN/GaN HEMTs on Si, SiC, and diamond substrates

A El Helou, P Komarov, MJ Tadjer… - … on Electron Devices, 2020 - ieeexplore.ieee.org
Gallium nitride (GaN) high electron-mobility transistors (HEMTs) offer considerable high-
power operation but suffer in reliability due to potentially damaging self-heating. In this …

Transient thermal characterization of AlGaN/GaN HEMTs under pulsed biasing

G Pavlidis, D Kendig, ER Heller… - IEEE Transactions on …, 2018 - ieeexplore.ieee.org
The development of steady-state thermal characterization techniques for AlGaN/GaN high-
electron mobility transistors (HEMTs) has been used to measure the device's peak …