SixSnyGe1-xy and related alloy heterostructures based on Si, Ge and Sn
J Kouvetakis, M Bauer, J Tolle - US Patent 7,598,513, 2009 - Google Patents
Z. Charafi and N. Bouarissa,“The effect of the violation of Vegard's law on the optical bowing
in SiGe alloys'. Phys. Lett. A. vol. 234, pp. 493-497 (1997). H. Kajiyama, SI. Muramatsu, T …
in SiGe alloys'. Phys. Lett. A. vol. 234, pp. 493-497 (1997). H. Kajiyama, SI. Muramatsu, T …
GeSn alloys and ordered phases with direct tunable bandgaps grown directly on silicon
J Kouvetakis, M Bauer, J Menendez, CW Hu… - US Patent …, 2009 - Google Patents
(57) ABSTRACT A method for depositing an epitaxial Ge—Sn layer on a substrate in a CVD
reaction chamber includes introducing into the chamber a gaseous precursor comprising …
reaction chamber includes introducing into the chamber a gaseous precursor comprising …
Method for preparing ge1-x-ysnxey (e= p, as, sb) semiconductors and related si-ge-sn-e and si-ge-e analogs
J Kouvetakis, M Bauer, J Tolle, C Cook - US Patent 7,238,596, 2007 - Google Patents
US7238596B2 - Method for preparing Ge1-x-ySnxEy (E=P, As, Sb) semiconductors and
related Si-Ge-Sn-E and Si-Ge-E analogs - Google Patents US7238596B2 - Method for …
related Si-Ge-Sn-E and Si-Ge-E analogs - Google Patents US7238596B2 - Method for …
The Ge–C local mode in epitaxial GeC and Ge-rich GeSiC alloys
WH Weber, BK Yang, M Krishnamurthy - Applied physics letters, 1998 - pubs.aip.org
The Raman signature of the local Ge–C mode for substitutional C is identified as a narrow
line (8 cm− 1 full width at half maximum) near 530 cm− 1 in alloy films of Ge 1− y C y (0⩽ y⩽ …
line (8 cm− 1 full width at half maximum) near 530 cm− 1 in alloy films of Ge 1− y C y (0⩽ y⩽ …
Substitutional carbon in alloys as measured with infrared absorption and Raman spectroscopy
M Melendez-Lira, J Menendez, KM Kramer… - Journal of applied …, 1997 - pubs.aip.org
We present a study of the infrared absorption and Raman scattering intensity of the local
carbon mode in Si 1− y C y alloys grown by direct carbon implantation followed by different …
carbon mode in Si 1− y C y alloys grown by direct carbon implantation followed by different …
Short-range order and strain in SiGeC alloys probed by phonons
E Finkman, F Meyer, M Mamor - Journal of Applied Physics, 2001 - pubs.aip.org
We report a detailed study of the dependence of the vibrational modes in rapid thermal
chemical vapor deposition grown Si 1− x− y Ge x C y samples on substitutional carbon …
chemical vapor deposition grown Si 1− x− y Ge x C y samples on substitutional carbon …
Free‐Energy Parameterization and Thermodynamics in Si–Ge–Sn Alloys
Different models are used to describe and parameterize enthalpy and free energy in GeSnSi
alloys over the entire composition range from density‐functional theory calculations and are …
alloys over the entire composition range from density‐functional theory calculations and are …
Acetylene on Si (1 1 1): carbon incorporation in the growth of c-SiC thin layers
M De Crescenzi, R Bernardini, S Pollano, R Gunnella… - Surface science, 2001 - Elsevier
Pseudomorphic c-SiC alloys on Si (111) were grown by exposure to acetylene (C2H2) in
ultra-high-vacuum conditions. The behavior of C incorporation in the lattice for different …
ultra-high-vacuum conditions. The behavior of C incorporation in the lattice for different …
Raman and Fourier transform infrared study of substitutional carbon incorporation in rapid thermal chemical vapor deposited Si1− x− yGexCy on (1 0 0) Si
J Wasyluk, TS Perova, F Meyer - Journal of Applied Physics, 2010 - pubs.aip.org
We report on a detailed study of the dependence of the vibrational modes in rapid thermal
chemical vapor deposited Si 1− x− y Ge x C y films on the substitutional carbon …
chemical vapor deposited Si 1− x− y Ge x C y films on the substitutional carbon …
Characterization of amorphous carbon rich Si1− xCx thin films obtained using high energy hydrocarbon ion beams on Si
H Huck, EB Halac, C Oviedo, G Zampieri… - Applied surface …, 1999 - Elsevier
Amorphous Si1− xCx films, with x ranging from 0.54 to 0.71 and low hydrogen content (less
than 5%) were grown by high-energy hydrocarbon ion beam deposition on silicon wafers …
than 5%) were grown by high-energy hydrocarbon ion beam deposition on silicon wafers …