Modelling the elastic energy of a bifurcated wafer: a benchmark of the analytical solution vs. the ANSYS finite element analysis

V Vinciguerra, GL Malgioglio, A Landi - Composite Structures, 2022 - Elsevier
The phenomenon of bifurcation significantly impacts the warpage in wafers and
consequently the yield and reliability of final systems in packages (SiPs). In this work, an …

Flexible hybrid electronics technology using die-first FOWLP for high-performance and scalable heterogeneous system integration

T Fukushima, A Alam, A Hanna… - IEEE Transactions …, 2018 - ieeexplore.ieee.org
A technological platform is established for scalable flexible hybrid electronics based on a
novel fan-out wafer-level packaging (FOWLP) methodology. Small dielets are embedded in …

Modified Stoney formula for determining stress within thin films on large-deformation isotropic circular plates

H Liu, M Dai, X Tian, S Chen, F Dong, L Lu - AIP Advances, 2021 - pubs.aip.org
The Stoney formula is widely used to obtain residual stress in films on isotropic circular
plates. However, in the case of large deformations, this formula produces significant errors …

Wind-induced collapse mechanism and failure criteria of super-large cooling tower based on layered shell element model

W Li, S Ke, J Yang, H Wu, F Wang, G Han - Journal of Wind Engineering …, 2022 - Elsevier
Many wind-induced collapse events of super-large cooling tower have been taken place in
history. Existing norms are limited within local excessive strength or buckling failure of the …

Determination of the Equivalent Thickness of a Taiko Wafer Using ANSYS Finite Element Analysis

V Vinciguerra, GL Malgioglio, A Landi, M Renna - Applied Sciences, 2023 - mdpi.com
The successful handling of large semiconductor wafers is crucial for scaling up their
production. Early-stage warpage control allows the prevention of undesirable asymmetric …

Models of Bifurcation in a Semiconductor Wafer: A Comparison of the Analytical Solution vs. the ANSYS Finite Element Analysis

V Vinciguerra, GL Malgioglio… - 2022 23rd International …, 2022 - ieeexplore.ieee.org
In this work we report a relationship between the curvature provided by the Stoney equation,
considered in an" extended" linear regime, and the arithmetic average of the main …

Investigating the Occurrence of Bifurcation in Large Metalized Wafers using ANSYS Layered Shell Elements

V Vinciguerra, M Boutaleb… - … and Multi-Physics …, 2023 - ieeexplore.ieee.org
Bifurcation is a non-linear phenomenon which determines the emergence of an abrupt
degeneration in the symmetry of large wafers undergoing the large-scale integration …

Models of Bifurcation and Gravity Induced Deflection in Wide Band Gap 4H-SiC Semiconductor Wafers

V Vinciguerra, GL Malgioglio, A Landi… - … , Mechanical and Multi …, 2023 - ieeexplore.ieee.org
Handling and warpage control of larger and thinner semiconductor wafers can be critical
within the large-scale semiconductor manufacturing process. With the development of 8” …

An empirical equation for prediction of silicon wafer deformation

X Zhu, X Chen, H Liu, R Kang, B Zhang… - Materials Research …, 2017 - iopscience.iop.org
A thin subsurface damage layer is often formed in the ground layer of a silicon wafer.
Compressive stresses exist in the damage layer of the wafer and cause the wafer to deflect …

Extension of the Equivalent Thickness Concept to the Bifurcation of Large Semiconductor Front Side Metal Taiko Wafer investigated by ANSYS Finite Element …

V Vinciguerra, GL Malgioglio… - 2024 25th International …, 2024 - ieeexplore.ieee.org
Scaling up the production of power devices involves, in the semiconductor industry, the use
of large semiconductor 8” and 12” wafers of Si or SiC. Their use implicates a successful an …