Modelling the elastic energy of a bifurcated wafer: a benchmark of the analytical solution vs. the ANSYS finite element analysis
V Vinciguerra, GL Malgioglio, A Landi - Composite Structures, 2022 - Elsevier
The phenomenon of bifurcation significantly impacts the warpage in wafers and
consequently the yield and reliability of final systems in packages (SiPs). In this work, an …
consequently the yield and reliability of final systems in packages (SiPs). In this work, an …
Flexible hybrid electronics technology using die-first FOWLP for high-performance and scalable heterogeneous system integration
A technological platform is established for scalable flexible hybrid electronics based on a
novel fan-out wafer-level packaging (FOWLP) methodology. Small dielets are embedded in …
novel fan-out wafer-level packaging (FOWLP) methodology. Small dielets are embedded in …
Modified Stoney formula for determining stress within thin films on large-deformation isotropic circular plates
The Stoney formula is widely used to obtain residual stress in films on isotropic circular
plates. However, in the case of large deformations, this formula produces significant errors …
plates. However, in the case of large deformations, this formula produces significant errors …
Wind-induced collapse mechanism and failure criteria of super-large cooling tower based on layered shell element model
W Li, S Ke, J Yang, H Wu, F Wang, G Han - Journal of Wind Engineering …, 2022 - Elsevier
Many wind-induced collapse events of super-large cooling tower have been taken place in
history. Existing norms are limited within local excessive strength or buckling failure of the …
history. Existing norms are limited within local excessive strength or buckling failure of the …
Determination of the Equivalent Thickness of a Taiko Wafer Using ANSYS Finite Element Analysis
V Vinciguerra, GL Malgioglio, A Landi, M Renna - Applied Sciences, 2023 - mdpi.com
The successful handling of large semiconductor wafers is crucial for scaling up their
production. Early-stage warpage control allows the prevention of undesirable asymmetric …
production. Early-stage warpage control allows the prevention of undesirable asymmetric …
Models of Bifurcation in a Semiconductor Wafer: A Comparison of the Analytical Solution vs. the ANSYS Finite Element Analysis
V Vinciguerra, GL Malgioglio… - 2022 23rd International …, 2022 - ieeexplore.ieee.org
In this work we report a relationship between the curvature provided by the Stoney equation,
considered in an" extended" linear regime, and the arithmetic average of the main …
considered in an" extended" linear regime, and the arithmetic average of the main …
Investigating the Occurrence of Bifurcation in Large Metalized Wafers using ANSYS Layered Shell Elements
V Vinciguerra, M Boutaleb… - … and Multi-Physics …, 2023 - ieeexplore.ieee.org
Bifurcation is a non-linear phenomenon which determines the emergence of an abrupt
degeneration in the symmetry of large wafers undergoing the large-scale integration …
degeneration in the symmetry of large wafers undergoing the large-scale integration …
Models of Bifurcation and Gravity Induced Deflection in Wide Band Gap 4H-SiC Semiconductor Wafers
V Vinciguerra, GL Malgioglio, A Landi… - … , Mechanical and Multi …, 2023 - ieeexplore.ieee.org
Handling and warpage control of larger and thinner semiconductor wafers can be critical
within the large-scale semiconductor manufacturing process. With the development of 8” …
within the large-scale semiconductor manufacturing process. With the development of 8” …
An empirical equation for prediction of silicon wafer deformation
X Zhu, X Chen, H Liu, R Kang, B Zhang… - Materials Research …, 2017 - iopscience.iop.org
A thin subsurface damage layer is often formed in the ground layer of a silicon wafer.
Compressive stresses exist in the damage layer of the wafer and cause the wafer to deflect …
Compressive stresses exist in the damage layer of the wafer and cause the wafer to deflect …
Extension of the Equivalent Thickness Concept to the Bifurcation of Large Semiconductor Front Side Metal Taiko Wafer investigated by ANSYS Finite Element …
V Vinciguerra, GL Malgioglio… - 2024 25th International …, 2024 - ieeexplore.ieee.org
Scaling up the production of power devices involves, in the semiconductor industry, the use
of large semiconductor 8” and 12” wafers of Si or SiC. Their use implicates a successful an …
of large semiconductor 8” and 12” wafers of Si or SiC. Their use implicates a successful an …