Piezo-actuated smart mechatronic systems: Nonlinear modeling, identification, and control

Z Yuan, S Zhou, Z Zhang, Z Xiao, C Hong… - … Systems and Signal …, 2024 - Elsevier
Precise actuation is a widely utilized technology in the realm of high-end equipment.
Piezoelectric actuators (PEAs) stand out due to their exceptional attributes, including high …

Plant cell wall characterization using scanning probe microscopy techniques

JM Yarbrough, ME Himmel, SY Ding - Biotechnology for biofuels, 2009 - Springer
Lignocellulosic biomass is today considered a promising renewable resource for bioenergy
production. A combined chemical and biological process is currently under consideration for …

AFM image reconstruction for deformation measurements by digital image correlation

Y Sun, JHL Pang - Nanotechnology, 2006 - iopscience.iop.org
The scanner drift of the atomic force microscope (AFM) is a great disadvantage to the
application of digital image correlation to micro/nano-scale deformation measurements. This …

Nanoscale deformation measurement of microscale interconnection assemblies by a digital image correlation technique

Y Sun, JHL Pang, W Fan - Nanotechnology, 2007 - iopscience.iop.org
The continuous miniaturization of microelectronic devices and interconnections demand
more and more experimental strain/stress analysis of micro-and nanoscale components for …

Drift and spatial distortion elimination in atomic force microscopy images by the digital image correlation technique

ZH Xu, XD Li, MA Sutton, N Li - The Journal of Strain …, 2008 - journals.sagepub.com
The characterization of nanomaterials and nanostructures on the nanoscale has been a
tremendous challenge for many existing testing and measurement techniques. With the …

Identification, control and hysteresis compensation of a 3 DOF metrological AFM

R Merry, M Uyanik, R van de Molengraft… - Asian Journal of …, 2009 - Wiley Online Library
Abstract Atomic Force Microscopes (AFMs) are widely used for the investigation of samples
at the nanometer scale. The metrological AFM used in this work uses a 3 degrees‐of …

An incremental Hammerstein-like modeling approach for the decoupled creep, vibration and hysteresis dynamics of piezoelectric actuator

C Qi, F Gao, HX Li, S Li, X Zhao, Y Dong - Nonlinear Dynamics, 2015 - Springer
The modeling of the piezoelectric actuator is very important for the fast and accurate nano-
positioning control. However, the complex creep, vibration and hysteresis dynamics make …

Computer vision distortion correction of scanning probe microscopy images

I Gaponenko, P Tückmantel, B Ziegler, G Rapin… - Scientific reports, 2017 - nature.com
Since its inception, scanning probe microscopy (SPM) has established itself as the tool of
choice for probing surfaces and functionalities at the nanoscale. Although recent …

A new method for characterizing nonlinearity in scanning probe microscopes using digital image correlation

H Jin, HA Bruck - Nanotechnology, 2005 - iopscience.iop.org
It is essential to characterize the nonlinearity in scanning probe microscopes (SPMs) in
order to acquire spatial measurements with high levels of accuracy. In this paper, a new …

Hysteresis correction in the curvature adaptive optics system

Q Yang, C Ftaclas, M Chun, D Toomey - JOSA A, 2005 - opg.optica.org
An enhancing Coleman–Hodgdon model is introduced to describe the hysteresis curves of
the bimorph deformable mirror (DM). Hysteresis curves are measured from a bimorph DM …