Piezo-actuated smart mechatronic systems: Nonlinear modeling, identification, and control
Z Yuan, S Zhou, Z Zhang, Z Xiao, C Hong… - … Systems and Signal …, 2024 - Elsevier
Precise actuation is a widely utilized technology in the realm of high-end equipment.
Piezoelectric actuators (PEAs) stand out due to their exceptional attributes, including high …
Piezoelectric actuators (PEAs) stand out due to their exceptional attributes, including high …
Plant cell wall characterization using scanning probe microscopy techniques
Lignocellulosic biomass is today considered a promising renewable resource for bioenergy
production. A combined chemical and biological process is currently under consideration for …
production. A combined chemical and biological process is currently under consideration for …
AFM image reconstruction for deformation measurements by digital image correlation
Y Sun, JHL Pang - Nanotechnology, 2006 - iopscience.iop.org
The scanner drift of the atomic force microscope (AFM) is a great disadvantage to the
application of digital image correlation to micro/nano-scale deformation measurements. This …
application of digital image correlation to micro/nano-scale deformation measurements. This …
Nanoscale deformation measurement of microscale interconnection assemblies by a digital image correlation technique
Y Sun, JHL Pang, W Fan - Nanotechnology, 2007 - iopscience.iop.org
The continuous miniaturization of microelectronic devices and interconnections demand
more and more experimental strain/stress analysis of micro-and nanoscale components for …
more and more experimental strain/stress analysis of micro-and nanoscale components for …
Drift and spatial distortion elimination in atomic force microscopy images by the digital image correlation technique
The characterization of nanomaterials and nanostructures on the nanoscale has been a
tremendous challenge for many existing testing and measurement techniques. With the …
tremendous challenge for many existing testing and measurement techniques. With the …
Identification, control and hysteresis compensation of a 3 DOF metrological AFM
R Merry, M Uyanik, R van de Molengraft… - Asian Journal of …, 2009 - Wiley Online Library
Abstract Atomic Force Microscopes (AFMs) are widely used for the investigation of samples
at the nanometer scale. The metrological AFM used in this work uses a 3 degrees‐of …
at the nanometer scale. The metrological AFM used in this work uses a 3 degrees‐of …
An incremental Hammerstein-like modeling approach for the decoupled creep, vibration and hysteresis dynamics of piezoelectric actuator
C Qi, F Gao, HX Li, S Li, X Zhao, Y Dong - Nonlinear Dynamics, 2015 - Springer
The modeling of the piezoelectric actuator is very important for the fast and accurate nano-
positioning control. However, the complex creep, vibration and hysteresis dynamics make …
positioning control. However, the complex creep, vibration and hysteresis dynamics make …
Computer vision distortion correction of scanning probe microscopy images
I Gaponenko, P Tückmantel, B Ziegler, G Rapin… - Scientific reports, 2017 - nature.com
Since its inception, scanning probe microscopy (SPM) has established itself as the tool of
choice for probing surfaces and functionalities at the nanoscale. Although recent …
choice for probing surfaces and functionalities at the nanoscale. Although recent …
A new method for characterizing nonlinearity in scanning probe microscopes using digital image correlation
It is essential to characterize the nonlinearity in scanning probe microscopes (SPMs) in
order to acquire spatial measurements with high levels of accuracy. In this paper, a new …
order to acquire spatial measurements with high levels of accuracy. In this paper, a new …
Hysteresis correction in the curvature adaptive optics system
Q Yang, C Ftaclas, M Chun, D Toomey - JOSA A, 2005 - opg.optica.org
An enhancing Coleman–Hodgdon model is introduced to describe the hysteresis curves of
the bimorph deformable mirror (DM). Hysteresis curves are measured from a bimorph DM …
the bimorph deformable mirror (DM). Hysteresis curves are measured from a bimorph DM …