Tests for integrated circuit (IC) chips
L Balasubramanian, R Parekhji, KC Chekuri… - US Patent …, 2024 - Google Patents
A method for evaluating tests for fabricated integrated circuit (IC) chips includes providing,
design for fault injection (DfFI) instances of an IC design that characterize activatable states …
design for fault injection (DfFI) instances of an IC design that characterize activatable states …
Automated determinaton of failure mode distribution
F Maamari, SS Chonnad, A Chauhan… - US Patent …, 2023 - Google Patents
A method includes tracing from an observation point in a circuit to an input of the circuit to
produce a cone of influence that includes a plurality of components of the circuit. The …
produce a cone of influence that includes a plurality of components of the circuit. The …