Thickness dramatically affects the functionality of coatings. Accordingly, the techniques in
use to determine the thickness are of utmost importance for coatings research and …

Measuring the thickness and the composition of precious metal thin films is a challenging
task. Currently, the available techniques for thickness measurements are either destructive …

A method for the determination of the intermetallic diffusion coefficient in the Cu–Au system
is described based on energy dispersive X-ray techniques. XRF and EDS analysis were …

The homogeneous bulk assumption used in traditional electron probe microanalysis (EPMA)
can be applied for thin‐layered systems with individual layers as thick as 50 nm provided the …

The thermal conductance for a series of metal-graphite interfaces has been experimentally
measured with time-domain thermoreflectance (TDTR). For metals with Debye temperatures …

We present results from measurements of L α x-ray production cross sections of the
elements W, Pt, and Au by impact of electrons with energies in the range 10–30 keV. The …

The determination of thickness has a fundamental importance in all fields in which the
implementation of films and coatings are required and takes a crucial role in the …

The accuracy to which Cu and Al coatings can be determined, and the effect this has on the
quantification of the substrate, is investigated. Cu and Al coatings of nominally 5, 10, 15, and …

Effects related with the attenuation and deflection suffered by an electron beam when it
passes through a carbon conductive coating and an oxide film layer on the surface of bulk …

Results from thickness determination of single-element ultra-thin (< 10 nm) films by electron
probe microanalysis (EPMA) are presented. The studied samples were Ge, Sn, Ag and Au …