A 45 nm resilient microprocessor core for dynamic variation tolerance

KA Bowman, JW Tschanz, SLL Lu… - IEEE Journal of Solid …, 2010 - ieeexplore.ieee.org
A 45 nm microprocessor core integrates resilient error-detection and recovery circuits to
mitigate the clock frequency (F CLK) guardbands for dynamic parameter variations to …

Reliable on-chip systems in the nano-era: Lessons learnt and future trends

J Henkel, L Bauer, N Dutt, P Gupta, S Nassif… - Proceedings of the 50th …, 2013 - dl.acm.org
Reliability concerns due to technology scaling have been a major focus of researchers and
designers for several technology nodes. Therefore, many new techniques for enhancing and …

A survey and taxonomy of on-chip monitoring of multicore systems-on-chip

G Kornaros, D Pnevmatikatos - ACM Transactions on Design Automation …, 2013 - dl.acm.org
Billion transistor systems-on-chip increasingly require dynamic management of their
hardware components and careful coordination of the tasks that they carry out. Diverse real …

DNN engine: A 28-nm timing-error tolerant sparse deep neural network processor for IoT applications

PN Whatmough, SK Lee, D Brooks… - IEEE Journal of Solid …, 2018 - ieeexplore.ieee.org
This paper presents a 28-nm system-on-chip (SoC) for Internet of things (IoT) applications
with a programmable accelerator design that implements a powerful fully connected deep …

A power-efficient 32 bit ARM processor using timing-error detection and correction for transient-error tolerance and adaptation to PVT variation

D Bull, S Das, K Shivashankar… - IEEE Journal of Solid …, 2010 - ieeexplore.ieee.org
Razor is a hybrid technique for dynamic detection and correction of timing errors. A
combination of error detecting circuits and micro-architectural recovery mechanisms creates …

Postsilicon voltage guard-band reduction in a 22 nm graphics execution core using adaptive voltage scaling and dynamic power gating

M Cho, ST Kim, C Tokunaga… - IEEE Journal of Solid …, 2016 - ieeexplore.ieee.org
In high volume manufacturing, conventional approach to deal with inverse-temperature
dependence (ITD) and aging is to add a post silicon flat voltage guard band to all dies based …

Bubble Razor: An architecture-independent approach to timing-error detection and correction

M Fojtik, D Fick, Y Kim, N Pinckney… - … Solid-State Circuits …, 2012 - ieeexplore.ieee.org
Several methods that eliminate timing margins by detecting and correcting transient delay
errors have been proposed. These Razor-style systems replace critical flip-flops with ones …

Voltage smoothing: Characterizing and mitigating voltage noise in production processors via software-guided thread scheduling

VJ Reddi, S Kanev, W Kim… - 2010 43rd Annual …, 2010 - ieeexplore.ieee.org
Parameter variations have become a dominant challenge in microprocessor design. Voltage
variation is especially daunting because it happens so rapidly. We measure and …

Robust system design to overcome CMOS reliability challenges

S Mitra, K Brelsford, YM Kim… - IEEE Journal on …, 2011 - ieeexplore.ieee.org
Today's mainstream electronic systems typically assume that transistors and interconnects
operate correctly over their useful lifetime. With enormous complexity and significantly …

Time-borrowing circuit designs and hardware prototyping for timing error resilience

MR Choudhury, V Chandra, RC Aitken… - IEEE transactions on …, 2012 - ieeexplore.ieee.org
As dynamic variability increases with CMOS scaling, it is essential to incorporate large
design-time timing margins to ensure yield and reliable operation. Online techniques for …