Hydrogen blistering of silicon: Progress in fundamental understanding

B Terreault - Physica status solidi (a), 2007 - Wiley Online Library
When silicon is implanted with a sufficient concentration of H ions, at low to moderate
temperature, and subsequently annealed at high temperature, dome‐shaped gas‐filled …

Effect of the order of He+ and H+ ion co-implantation on damage generation and thermal evolution of complexes, platelets, and blisters in silicon

N Daghbouj, N Cherkashin, FX Darras… - Journal of Applied …, 2016 - pubs.aip.org
Hydrogen and helium co-implantation is nowadays used to efficiently transfer thin Si layers
and fabricate silicon on insulator wafers for the microelectronic industry. The synergy …

Hydrogen bombardment-induced nano blisters in multilayered Mo/Si coatings

B Yuan, S Wang, CM Harvey, X Guo, S Wang - Thin-Walled Structures, 2025 - Elsevier
Abstract Nanometer-thick multilayered Mo/Si coatings, employed as artificial Bragg
structures, are essential for reflecting specific wavelengths of light in synchrotrons, space …

Localized exfoliation versus delamination in H and He coimplanted (001) Si

S Reboh, AA De Mattos, JF Barbot, A Declemy… - Journal of Applied …, 2009 - pubs.aip.org
X-ray diffraction measurements as well as electron (scanning and transmission), optical, and
atomic force microscopies are used to study the thermally induced stress relief mechanisms …

Study of hydrogen implantation-induced blistering in GaSb for potential layer transfer applications

R Pathak, U Dadwal, R Singh - Journal of Physics D: Applied …, 2017 - iopscience.iop.org
GaSb samples were implanted by 100 keV hydrogen ions (H+) at room temperature with
fluence values of 1× 10 17 and 2× 10 17 ions cm− 2. Post-implantation annealing studies …

Modification mechanisms of silicon thin films in low-temperature hydrogen plasmas

V Martirosyan, O Joubert… - Journal of Physics D …, 2018 - iopscience.iop.org
To achieve quasi-atomic precision etching of thin film materials in advanced transistors, a
method based on light ion implantation and consisting of two sequential steps—(1) surface …

Mechanisms of ion-induced GaN thin layer splitting

O Moutanabbir, YJ Chabal, M Chicoine… - Nuclear Instruments and …, 2009 - Elsevier
The underlying physics and the role of H-defect interaction in H ion-induced splitting of GaN
were investigated by transmission electron microscopy, high resolution X-ray diffraction …

Strain in hydrogen-implanted Si investigated using dark-field electron holography

N Cherkashin, S Reboh, MJ Hÿtch… - Applied Physics …, 2013 - iopscience.iop.org
The microstructure of ion-implanted crystals is profoundly dictated by mechanical strain
developing in interplay with structural defects. Understanding the origin of strain during the …

Raman characterization of hydrogen ion implanted silicon:“High-dose effect”?

SV Ovsyannikov, VV Shchennikov Jr… - Physica B: Condensed …, 2008 - Elsevier
The Raman spectra of nanostructures formed on silicon Si single-crystalline wafers by
implantation with hydrogen ions of fluencies ranging within D∼ 2× 1016–3× 1017cm− 2 are …

Elaboration and characterization of hydrogen standard stable under heavy ion irradiation: Application to nuclear astrophysics

G Genard, M Yedji, GG Ross, G Terwagne - Nuclear Instruments and …, 2007 - Elsevier
A hydrogen standard has been carried out by ion implantation in silicon. The silicon wafer
was implanted with hydrogen at different energies and fluences to provide a∼ 100nm flat …