Neural networks (NNs) have proven their ability to deal with many computer vision tasks,
including image-based remote sensing such as the identification and segmentation of …

Soft errors are the primary concern in space and terrestrial integrated circuit applications.
When a charged particle from space collides with a scaled memory circuit, a transient pulse …

Deep sub-micron memory devices play a crucial role in space electronic applications due to
their susceptibility to single-event upset and double-node upset types of soft errors. When a …

This paper proposed a radiation-hardened memory cell (RHMC12T) by polar design for
space applications. The proposed cell has the following advantages:(1) it can tolerate all …

Various charged particles in space, including α-particles, neutrons, heavy ions, and photons,
create stability and reliability concerns in memory circuits. Furthermore, these particles …

Many charged particles in space, including α-particles, neutrons, heavy ions, electrons, and
photons, wreak havoc on the stability and reliability of memory circuits. In addition, these …

In this paper, a 1.2 V, radiation-hardened 14T SRAM (RHS-14T) memory cell is proposed to
resilience the single event upset (SEU) and dual node upset (DNU) soft errors. The …

Various charged particles in space, including alpha particles, neutrons, heavy ions, and
photons, pose reliability and stability concerns for memory circuits. These particles also …

As transistors shrink in size, the integration density of memory circuits like Static Random
Access Memory (SRAM) cells rises, making them increasingly susceptible to Single Event …

Space radiation particles causes malfunction in electric circuits. It is especially susceptible to
memory-sensitive storage devices. When it affects data stored in the memory circuit, it …