A Data Pre-Processing Module for Improved-Accuracy Machine-Learning-based Micro-Single-Event-Latchup Detection
Single-event-latchup (SEL) in a semiconductor device is an undesirably induced high
current state, typically rendering the affected device to be non-functional and compromising …
current state, typically rendering the affected device to be non-functional and compromising …
Lock-V: A heterogeneous fault tolerance architecture based on Arm and RISC-V
This article presents Lock-V, a heterogeneous fault tolerance architecture that explores a
dual-core lockstep (DCLS) technique to mitigate single event upset (SEU) and common …
dual-core lockstep (DCLS) technique to mitigate single event upset (SEU) and common …
Configuration memory scrubbing of sram-based fpgas using a mixed 2-d coding technique
V Vlagkoulis, A Sari, G Antonopoulos… - … on Nuclear Science, 2022 - ieeexplore.ieee.org
SRAM-based field-programmable gate array (FPGA) vendors typically integrate error
correction codes (ECCs) into the configuration memory to assist designers in implementing …
correction codes (ECCs) into the configuration memory to assist designers in implementing …
LELAPE: An Open-Source Tool to Classify SEUs According to Their Multiplicity in Radiation-Ground Tests on Memories
JA Clemente, M Rezaei, JC Fabero… - … on Nuclear Science, 2024 - ieeexplore.ieee.org
This article presents Listas de Eventos Localizando Anomalías al Preparar Estadísticas
(LELAPE), an easy-to-use tool that aims at classifying the single-event upsets (SEUs) that …
(LELAPE), an easy-to-use tool that aims at classifying the single-event upsets (SEUs) that …
[HTML][HTML] SEE sensitivity of a COTS 28-nm SRAM-based FPGA under thermal neutrons and different incident angles
This paper provides an experimental study of the single-event upset (SEU) susceptibility
against thermal neutron radiation of a 28-nm bulk Commercial-Off-The-Shelf (COTS) Xilinx …
against thermal neutron radiation of a 28-nm bulk Commercial-Off-The-Shelf (COTS) Xilinx …
Single event effects assessment of ultrascale+ mpsoc systems under atmospheric radiation
The AMD UltraScale+ XCZU9EG, a multiprocessor system-on-chip (MPSoC) with integrated
programmable logic (PL), is vulnerable to the effects of atmospheric radiation due to its large …
programmable logic (PL), is vulnerable to the effects of atmospheric radiation due to its large …
Design of the offline test electronics for the nozzle system of proton therapy
P Huang, Z Yin, T Bian, S Hou, F Guan, S An… - Scientific Reports, 2024 - nature.com
A set of nozzle equipment for proton therapy is currently under development at China
Institute of Atomic Energy (CIAE). To facilitate the off-line commissioning of the whole …
Institute of Atomic Energy (CIAE). To facilitate the off-line commissioning of the whole …
Accelerated radiation test on quantized neural networks trained with fault aware training
Quantized neural networks (QNNs) are increasingly considered for adoption on multiple
applications, thanks to their high accuracy, but also since they allow for significantly lower …
applications, thanks to their high accuracy, but also since they allow for significantly lower …
Electron-Induced Single-Event Effect in 28 nm SRAM-Based FPGA
J Tian, R Cao, Y Liu, Y Cai, B Mei, L Zhao, S Cui, H Lv… - Electronics, 2024 - mdpi.com
As the feature size of integrated circuit decreases, the critical charge of single-event effect
decreases as well, making nano-scale devices more susceptible to the high-energy charged …
decreases as well, making nano-scale devices more susceptible to the high-energy charged …
Preventing Soft Errors and Hardware Trojans in RISC-V Cores
EB Annink, G Rauwerda, E Hakkennes… - … on Defect and Fault …, 2022 - ieeexplore.ieee.org
Soft errors in embedded systems' memories like single-event upsets and multiple-bit upsets
lead to data and instruction corruption. Therefore, devices deployed in harsh environments …
lead to data and instruction corruption. Therefore, devices deployed in harsh environments …