Artificial neural network based test escape screening using generative model
M Shintani, M Inoue, Y Nakamura - 2018 IEEE International …, 2018 - ieeexplore.ieee.org
In test of large scale integration (LSI) circuit, test escape is always regarded as a critical
issue since significant cost is imposed to manufacturing cost. In this paper, we propose a …
issue since significant cost is imposed to manufacturing cost. In this paper, we propose a …
An artificial neural network approach for screening test escapes
In this paper we investigate the application of an artificial neural network (ANN) for
screening test escapes. Specifically, we propose to train an autoencoder, an ANN, in an …
screening test escapes. Specifically, we propose to train an autoencoder, an ANN, in an …
Improving Efficiency and Robustness of Gaussian Process Based Outlier Detection via Ensemble Learning
M Eiki, T Nakamura, M Kajiyama… - 2023 IEEE …, 2023 - ieeexplore.ieee.org
Although automotive semiconductors must comply with the standard dynamic part average
testing (DPAT) defined by the Automotive Electronics Council, it remains challenging to …
testing (DPAT) defined by the Automotive Electronics Council, it remains challenging to …
Feasibility Study of Incremental Neural Network Based Test Escape Detection by Introducing Transfer Learning Technique
A Takaya, M Shintani - … Test Conference in Asia (ITC-Asia), 2023 - ieeexplore.ieee.org
Machine-learning-based test escape detection is gaining attention as a novel approach for
detecting faulty large-scale integrated circuits (LSIs) that traditional methods fail to detect. In …
detecting faulty large-scale integrated circuits (LSIs) that traditional methods fail to detect. In …
[图书][B] Test data analytics: Exploration of hidden patterns for test cost reduction and silicon characterization
CK Hsu - 2016 - search.proquest.com
The manufacturing test process for a modern integrated circuit encounters excessively long
test time and produces huge amount of test data. There is valuable information hidden in the …
test time and produces huge amount of test data. There is valuable information hidden in the …