[HTML][HTML] Bending induced electrical response variations in ultra-thin flexible chips and device modeling

H Heidari, N Wacker, R Dahiya - Applied Physics Reviews, 2017 - pubs.aip.org
Electronics that conform to 3D surfaces are attracting wider attention from both academia
and industry. The research in the field has, thus far, focused primarily on showcasing the …

Giant piezoresistance effect in silicon nanowires

R He, P Yang - Nature nanotechnology, 2006 - nature.com
The piezoresistance effect of silicon has been widely used in mechanical sensors,,, and is
now being actively explored in order to improve the performance of silicon transistors,. In …

Piezoresistance in silicon and its nanostructures

ACH Rowe - Journal of Materials Research, 2014 - cambridge.org
Piezoresistance (PZR) is the change in the electrical resistivity of a solid induced by an
applied mechanical stress. Its origin in bulk crystalline materials like silicon is principally a …

[PDF][PDF] Silicon piezoresistive stress sensors and their application in electronic packaging

JC Suhling, RC Jaeger - IEEE sensors journal, 2001 - js-engineering.com
Structural reliability of integrated circuit (IC) chips in electronic packages continues to be a
major concern due to ever-increasing die size, circuit densities, power dissipation, operating …

Fundamentals of silicon material properties for successful exploitation of strain engineering in modern CMOS manufacturing

PR Chidambaram, C Bowen… - … on Electron Devices, 2006 - ieeexplore.ieee.org
Semiconductor industry has increasingly resorted to strain as a means of realizing the
required node-to-node transistor performance improvements. Straining silicon …

CMOS stress sensors on [100] silicon

RC Jaeger, JC Suhling, R Ramani… - IEEE journal of solid …, 2000 - ieeexplore.ieee.org
CMOS analog stress sensor circuits based upon the piezoresistive behavior of MOSFET's
are presented. On the [100] surface, these circuits provide temperature-compensated …

Piezoresistive characteristics of short-channel MOSFETs on (100) silicon

AT Bradley, RC Jaeger, JC Suhling… - IEEE Transactions on …, 2001 - ieeexplore.ieee.org
This paper demonstrates that the intrinsic piezoresistive response of the MOSFET channel is
independent of length. The reported fall-off of the piezoresistive response of the transistor in …

Giant piezoresistance effects in silicon nanowires and microwires

JS Milne, ACH Rowe, S Arscott, C Renner - Physical review letters, 2010 - APS
The giant piezoresistance (PZR) previously reported in silicon nanowires is experimentally
investigated in a large number of depleted silicon nano-and microstructures. The resistance …

Phonon-limited mobility for electrons and holes in highly-strained silicon

N Roisin, G Brunin, GM Rignanese, D Flandre… - npj Computational …, 2024 - nature.com
Strain engineering is a widely used technique for enhancing the mobility of charge carriers
in semiconductors, but its effect is not fully understood. In this work, we perform first …

Errors associated with the design, calibration and application of piezoresistive stress sensors in (100) silicon

RC Jaeger, JC Suhling… - IEEE Transactions on …, 1994 - ieeexplore.ieee.org
Successful application of piezoresistive sensors for stress measurement requires both
properly designed sensors and accurately calibrated values of the piezoresistive coefficients …