Germicidal ultraviolet LEDs: A review of applications and semiconductor technologies

CJ Zollner, SP DenBaars, JS Speck… - Semiconductor …, 2021 - iopscience.iop.org
Ultraviolet light emitting diodes (UV LEDs) are one of the most promising technologies for
preventing future pandemics, improving health outcomes, and disinfecting water sources …

Disorder effects in nitride semiconductors: impact on fundamental and device properties

C Weisbuch, S Nakamura, YR Wu, JS Speck - Nanophotonics, 2020 - degruyter.com
Semiconductor structures used for fundamental or device applications most often
incorporate alloy materials. In “usual” or “common” III–V alloys, based on the InGaAsP or …

The physics of recombinations in III-nitride emitters

A David, NG Young, C Lund… - ECS Journal of Solid …, 2019 - iopscience.iop.org
The physics of carrier recombinations in III-nitride light emitters are reviewed, with an
emphasis on experimental investigations. After a discussion of various methods of …

On the search for efficient solid state light emitters: Past, present, future

C Weisbuch - ECS Journal of Solid State Science and …, 2019 - iopscience.iop.org
The emergence of efficient solid state light emitters was the result of the remarkable
breakthroughs in the late 1980s and early 1990s in GaN-based materials and light emitting …

Thermal droop in III-nitride based light-emitting diodes: Physical origin and perspectives

M Meneghini, C De Santi, A Tibaldi, M Vallone… - Journal of applied …, 2020 - pubs.aip.org
This tutorial paper focuses on the physical origin of thermal droop, ie, the decrease in the
luminescence of light-emitting diodes (LEDs) induced by increasing temperature. III-nitride …

Injection mechanisms in a III-nitride light-emitting diode as seen by self-emissive electron microscopy

T Tak, CW Johnson, WY Ho, F Wu, M Sauty… - Physical Review …, 2023 - APS
We report on the investigation of an electrically biased high efficiency green III-nitride light-
emitting diode (LED) by electron emission microscopy (EEM) using a low-energy electron …

[HTML][HTML] Impact of doped barriers on the recombination coefficients of c-plane InGaN/GaN single quantum well light-emitting diodes

YC Chow, C Lynsky, S Nakamura… - Applied Physics …, 2022 - pubs.aip.org
Differential carrier lifetime measurements were performed on c-plane InGaN/GaN single
quantum well (QW) light-emitting diodes (LEDs) of different QW indium compositions as well …

Measurement of minority carrier diffusion length in p-GaN using electron emission spectroscopy (EES)

WY Ho, YC Chow, S Nakamura, J Peretti… - Applied Physics …, 2023 - pubs.aip.org
Electron emission spectroscopy was performed on metalorganic chemical vapor deposition
grown pn−-n+ junctions with p-thicknesses ranging from 50 to 300 nm, doped with [Mg] …

[HTML][HTML] Evidence for trap-assisted Auger recombination in MBE grown InGaN quantum wells by electron emission spectroscopy

DJ Myers, AC Espenlaub, K Gelzinyte… - Applied Physics …, 2020 - pubs.aip.org
We report on the direct measurement of hot electrons generated in the active region of blue
light-emitting diodes grown by ammonia molecular beam epitaxy by electron emission …

[HTML][HTML] Impact of defects on Auger recombination in c-plane InGaN/GaN single quantum well in the efficiency droop regime

W Liu, C Haller, Y Chen, T Weatherley… - Applied Physics …, 2020 - pubs.aip.org
We study the impact of non-radiative defects on Auger recombination in c-plane InGaN/GaN
single quantum wells (SQWs) in the efficiency droop regime using high injection time …