Development of surface reconstruction algorithms for optical interferometric measurement
D Wu, F Fang - Frontiers of Mechanical Engineering, 2021 - Springer
Optical interferometry is a powerful tool for measuring and characterizing areal surface
topography in precision manufacturing. A variety of instruments based on optical …
topography in precision manufacturing. A variety of instruments based on optical …
Wavelet transform as a processing tool in white-light interferometry
P Sandoz - Optics letters, 1997 - opg.optica.org
Results of the application of wavelet transform for signal processing in white-light
interferometry are reported. The mother wavelet frequency is chosen to be the light-source …
interferometry are reported. The mother wavelet frequency is chosen to be the light-source …
Unambiguous profilometry by fringe-order identification in white-light phase-shifting interferometry
P Sandoz, R Devillers, A Plata - Journal of modern optics, 1997 - Taylor & Francis
This paper proposes a white-light phase-shifting method for interferometry, in which the
absolute phase of each point is measured individually. During the axial scanning of the …
absolute phase of each point is measured individually. During the axial scanning of the …
Full-field birefringence imaging by thermal-light polarization-sensitive optical coherence tomography. I. Theory
J Moreau, V Loriette, AC Boccara - Applied Optics, 2003 - opg.optica.org
A method for measuring birefringence by use of thermal-light polarization-sensitive optical
coherence tomography is presented. The use of thermal light brings to polarization-sensitive …
coherence tomography is presented. The use of thermal light brings to polarization-sensitive …
Simultaneous dual-wavelength phase-shifting interferometry for surface topography measurement
Q Liu, L Li, H Zhang, W Huang, X Yue - Optics and Lasers in Engineering, 2020 - Elsevier
To deal with vibration disturbance in interferometric measurement of surface topography, we
present a simultaneous dual-wavelength phase-shifting interferometry (SDWPSI). SDWPSI …
present a simultaneous dual-wavelength phase-shifting interferometry (SDWPSI). SDWPSI …
[PDF][PDF] Surface profilers, multiple wavelength, and white light interferometry
J Schmit, K Creath, JC Wyant - Optical shop testing, 2007 - kathycreath.com
Over the last 25 years driven by both the development of new technologies such as fast
computers and solid state devices and the necessity to precisely inspect these increasingly …
computers and solid state devices and the necessity to precisely inspect these increasingly …
Direct quadratic polynomial fitting for fringe peak detection of white light scanning interferograms
MC Park, SW Kim - Optical Engineering, 2000 - spiedigitallibrary.org
We present a new computational method of white light scanning interferometry for 3-D
surface mapping. This method accomplishes the task of detecting the true peak of the …
surface mapping. This method accomplishes the task of detecting the true peak of the …
Analysis of white light interferograms using wavelet methods
RJ Recknagel, G Notni - Optics Communications, 1998 - Elsevier
Several methods for the analysis of white light interferograms are presented and their
performance is compared to a new method employing the wavelet transform in connection …
performance is compared to a new method employing the wavelet transform in connection …
A novel surface recovery algorithm in white light interferometry
Z Lei, X Liu, L Chen, W Lu, S Chang - Measurement, 2016 - Elsevier
White-light interferometry (WLI) is an established method for surface measurement. In WLI,
surface recovery algorithm from series of vertical scanning white light interferogram is pivotal …
surface recovery algorithm from series of vertical scanning white light interferogram is pivotal …
Large-field step-structure surface measurement using a femtosecond laser
Y Wang, G Xu, S Xiong, G Wu - Optics express, 2020 - opg.optica.org
We present a femtosecond laser-based interferometry for step-structure surface
measurement with a large field of view. A height axial scanning range of 348 µm is achieved …
measurement with a large field of view. A height axial scanning range of 348 µm is achieved …