Deep traps in GaN-based structures as affecting the performance of GaN devices
AY Polyakov, IH Lee - Materials Science and Engineering: R: Reports, 2015 - Elsevier
New developments in theoretical studies of defects and impurities in III-Nitrides as pertinent
to compensation and recombination in these materials are discussed. New results on …
to compensation and recombination in these materials are discussed. New results on …
Overview of band-edge and defect related luminescence in aluminum nitride
T Koppe, H Hofsäss, U Vetter - Journal of Luminescence, 2016 - Elsevier
This review gives the reader an overview of the published results describing near band-
edge as well as defect related luminescence in aluminum nitride, also presenting findings …
edge as well as defect related luminescence in aluminum nitride, also presenting findings …
A first-principles understanding of point defects and impurities in GaN
JL Lyons, D Wickramaratne… - Journal of Applied …, 2021 - pubs.aip.org
Attaining control over the electrical conductivity of gallium nitride through impurity doping is
one of the foremost achievements in semiconductor science. Yet, unwanted contaminants …
one of the foremost achievements in semiconductor science. Yet, unwanted contaminants …
Dysprosium-doped cadmium oxide as a gateway material for mid-infrared plasmonics
The interest in plasmonic technologies surrounds many emergent optoelectronic
applications, such as plasmon lasers, transistors, sensors and information storage. Although …
applications, such as plasmon lasers, transistors, sensors and information storage. Although …
Origins of optical absorption and emission lines in AlN
To aid the development of AlN-based optoelectronics, it is essential to identify the defects
that cause unwanted light absorption and to minimize their impact. Using hybrid functional …
that cause unwanted light absorption and to minimize their impact. Using hybrid functional …
[HTML][HTML] On compensation in Si-doped AlN
Controllable n-type doping over wide ranges of carrier concentrations in AlN, or Al-rich
AlGaN, is critical to realizing next-generation applications in high-power electronics and …
AlGaN, is critical to realizing next-generation applications in high-power electronics and …
Origination and evolution of point defects in AlN film annealed at high temperature
C Kai, H Zang, J Ben, K Jiang, Z Shi, Y Jia, X Cao… - Journal of …, 2021 - Elsevier
While high temperature annealing has been proven to be an effective strategy to reduce
threading dislocation density of AlN film, the point defect induced near-ultraviolet emission …
threading dislocation density of AlN film, the point defect induced near-ultraviolet emission …
KOH based selective wet chemical etching of AlN, AlxGa1− xN, and GaN crystals: A way towards substrate removal in deep ultraviolet-light emitting diode
A controllable and smooth potassium hydroxide-based wet etching technique was
developed for the AlGaN system. High selectivity between AlN and AlxGa1ÀxN (up to 12Â) …
developed for the AlGaN system. High selectivity between AlN and AlxGa1ÀxN (up to 12Â) …
Thermal conductivity of single-crystalline AlN
R Rounds, B Sarkar, A Klump, C Hartmann… - Applied Physics …, 2018 - iopscience.iop.org
The thermal conductivity of AlN single crystals grown by physical vapor transport (PVT) and
hydride vapor phase epitaxy (HVPE) was measured in the range of 30 to 325 K by the 3ω …
hydride vapor phase epitaxy (HVPE) was measured in the range of 30 to 325 K by the 3ω …
Tracking of point defects in the full compositional range of AlGaN via photoluminescence spectroscopy
A comprehensive energy map as a function of AlGaN composition over the whole alloy
range is presented for commonly observed point defects in nominally intrinsic, n‐, and p …
range is presented for commonly observed point defects in nominally intrinsic, n‐, and p …