On the accurate measurement of structure-factor amplitudes and phases by electron diffraction
JCH Spence - Acta Crystallographica Section A: Foundations of …, 1993 - journals.iucr.org
A review is given of research into the measurement of crystal structure-factor amplitudes and
phases by transmission electron diffraction. Accuracies for amplitudes are commonly a …
phases by transmission electron diffraction. Accuracies for amplitudes are commonly a …
Automated lattice parameter measurement from HOLZ lines and their use for the measurement of oxygen content in YBa2Cu3O7-δ from nanometer-sized region
JM Zuo - Ultramicroscopy, 1992 - Elsevier
An algorithm is described which automatically adjusts values of lattice parameters or high
voltage for best fit to the high-order Laue zone (HOLZ) lines in experimental convergent …
voltage for best fit to the high-order Laue zone (HOLZ) lines in experimental convergent …
Analysis of local strain in aluminium interconnects by energy filtered CBED
S Krämer, J Mayer, C Witt, A Weickenmeier, M Rühle - Ultramicroscopy, 2000 - Elsevier
Energy filtered convergent beam electron diffraction (CBED) was used to investigate
localised strain in aluminium interconnects. The quantitative analysis of the experimental …
localised strain in aluminium interconnects. The quantitative analysis of the experimental …
Measurement of lattice parameter and strain using convergent beam electron diffraction
V Randle, I Barker, B Ralph - Journal of Electron Microscopy …, 1989 - Wiley Online Library
A brief review is presented of the methods of measuring lattice parameters and strain using
diffraction techniques. The presence of strain leads to broadening of diffraction maxima …
diffraction techniques. The presence of strain leads to broadening of diffraction maxima …
On the unique evaluation of local lattice parameters by convergent-beam electron diffraction
We summarize some practical aspects of using convergent-beam electron diffraction
(CBED) patterns for determination of three-dimensional lattice parameters in crystalline …
(CBED) patterns for determination of three-dimensional lattice parameters in crystalline …
Dynamical diffraction effect on HOLZ-pattern geometry in Si-Ge alloys and determination of local lattice parameter
Y Tomokiyo, S Matsumura, T Okuyama, T Yasunaga… - Ultramicroscopy, 1994 - Elsevier
Higher-order Laue zone (HOLZ) patterns are observed in convergent-beam electron
diffraction (CBED) patterns of Si-Ge alloys and the dynamical effect on HOLZ lines is …
diffraction (CBED) patterns of Si-Ge alloys and the dynamical effect on HOLZ lines is …
Dynamical electron diffraction analysis of lattice parameters, Debye—Waller factors and order in Ti-Al and Ti-Ga alloys
CJ Rossouw, MA Gibson, CT Forwood - Ultramicroscopy, 1996 - Elsevier
It is shown that higher order Laue zone (HOLZ) measurements under strong zone-axis
dynamical diffraction conditions can be used to measure crystal lattice parameters with …
dynamical diffraction conditions can be used to measure crystal lattice parameters with …
Structural and analytical characterization of Si1-x Gex/Si heterostructures by Rutherford backscattering spectrometry and channeling, analytical electron microscopy …
A Armigliato, M Servidori, F Cembali… - Microscopy …, 1992 - mmm.edpsciences.org
Thin film Si1-xGex alloys have been grown on silicon by molecular beam epitaxy with
nominal composition, x, between 10 and 20 at%. These heterostructures have several …
nominal composition, x, between 10 and 20 at%. These heterostructures have several …
III‐V ternary semiconductor heterostructures: The choice of an appropriate compositional analysis technique
EG Bithell, WM Stobbs - Journal of applied physics, 1991 - pubs.aip.org
The composition of ternary III‐V semiconductor heterostructures can now be measured in a
number of ways. Conventional spectroscopic probe techniques are inappropriate for fine …
number of ways. Conventional spectroscopic probe techniques are inappropriate for fine …
JECP/HOLZ–an interactive computer program for simulation of HOLZ patterns
XZ Li - Journal of Applied Crystallography, 2005 - journals.iucr.org
Because a HOLZ (higher-order Laue zone) line corresponds to a HOLZ reflection that is
described by long reciprocal vector| g|, the position of the line will be very sensitive to the …
described by long reciprocal vector| g|, the position of the line will be very sensitive to the …