Generating model signals for interferometry

XC De Lega - US Patent 7,619,746, 2009 - Google Patents
4. 5 23s46 A 6/1985 Breckinridge et al. test Surface in a second mode of operation that
interferometri 4.576. 479 A 3, 1986 Downs cally profiles a topography of the test Surface …

Profiling complex surface structures using scanning interferometry

PJ De Groot, R Stoner, XC De Lega - US Patent 7,271,918, 2007 - Google Patents
(51) Int. Cl. G0IB II/02(2006.01) A method including comparing information derivable from
(52) US Cl 356/5.11: 356/497 a scanning interferometry signal for a first Surface location irr …

Interferometer and method for measuring characteristics of optically unresolved surface features

P De Groot, MJ Darwin, RT Stoner, GM Gallatin… - US Patent …, 2008 - Google Patents
Disclosed is an interferometry analysis method that includes comparing information
derivable from multiple interferometry signals corresponding to different surface locations of …

Interferometer for determining characteristics of an object surface, including processing and calibration

XC De Lega, P De Groot - US Patent 7,428,057, 2008 - Google Patents
Disclosed is a system including:(i) an interferometer config ured to direct test
electromagnetic radiation to a test surface and reference electromagnetic radiation to a …

Scanning interferometry for thin film thickness and surface measurements

PJ De Groot, XC De Lega - US Patent 7,324,210, 2008 - Google Patents
Int. Cl. GIB II/02(2006.01) A method including: providing a low coherence scanning (52) US
Cl........................ 356/497; 356/511; 356/504 interferometry data for at least one spatial …

Interferometry method for ellipsometry, reflectometry, and scatterometry measurements, including characterization of thin film structures

PJ De Groot - US Patent 7,139,081, 2006 - Google Patents
(57) ABSTRACT A method including: imaging test light emerging from a test object over a
range of angles to interfere with reference light on a detector, wherein the test and reference …

Profiling complex surface structures using scanning interferometry

PJ De Groot, R Stoner, XC De Lega - US Patent 7,106,454, 2006 - Google Patents
A method including comparing information derivable from a scanning interferometry signal
for a first surface location of a test object to information corresponding to multiple models of …

Spectrally-resolved white-light interferometry as a profilometry tool

J Calatroni, AL Guerrero, C Sainz, R Escalona - Optics & Laser Technology, 1996 - Elsevier
Phase-shifting interferometry and white-light interferometry are reliable techniques for
surface analysis in which the optical path difference has to be changed by some transducer …

Multiple-angle multiple-wavelength interferometer using high-NA imaging and spectral analysis

P De Groot - US Patent 7,869,057, 2011 - Google Patents
the invention relates to surface topography measurements of objects having thin films or
discrete structures of dissimilar materials. Such measurements are relevant to the …

Analyzing surface structure using scanning interferometry

P De Groot, XC De Lega - US Patent 8,126,677, 2012 - Google Patents
4,576.479 A 3/1986 Downs 6.545, 761 B1 4/2003 Aziz et al. 4,583,858. A 4/1986 Lebling et
al. 6,545,763 B1 4/2003 Kimetal. 4,618,262 A 10/1986 Maydan et al. 6,590,656 B2 7/2003 …