Multifunctional high entropy alloys enabled by severe lattice distortion

H Wang, Q He, X Gao, Y Shang, W Zhu… - Advanced …, 2024 - Wiley Online Library
Since 2004, the design of high entropy alloys (HEAs) has generated significant interest
within the materials science community due to their exceptional structural and functional …

Four-dimensional scanning transmission electron microscopy (4D-STEM): From scanning nanodiffraction to ptychography and beyond

C Ophus - Microscopy and Microanalysis, 2019 - cambridge.org
Scanning transmission electron microscopy (STEM) is widely used for imaging, diffraction,
and spectroscopy of materials down to atomic resolution. Recent advances in detector …

A literature review of in situ transmission electron microscopy technique in corrosion studies

Z Song, ZH Xie - Micron, 2018 - Elsevier
One of the biggest challenges in corrosion investigation is foreseeing precisely how and
where materials will degenerate in a designated condition owing to scarceness of accurate …

Lattice distortions in high-entropy alloys

LR Owen, NG Jones - Journal of Materials Research, 2018 - cambridge.org
One of the founding concepts of the high-entropy alloy (HEA) field was that the lattice
structures of multicomponent solid solution phases are highly distorted. The displacement of …

Patterned probes for high precision 4D-STEM bragg measurements

SE Zeltmann, A Müller, KC Bustillo, B Savitzky… - Ultramicroscopy, 2020 - Elsevier
Nanoscale strain mapping by four-dimensional scanning transmission electron microscopy
(4D-STEM) relies on determining the precise locations of Bragg-scattered electrons in a …

Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping

TC Pekin, C Gammer, J Ciston, AM Minor, C Ophus - Ultramicroscopy, 2017 - Elsevier
Scanning nanobeam electron diffraction strain mapping is a technique by which the
positions of diffracted disks sampled at the nanoscale over a crystalline sample can be used …

The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision

E Padgett, ME Holtz, P Cueva, YT Shao, E Langenberg… - Ultramicroscopy, 2020 - Elsevier
Scanning nanobeam electron diffraction (NBED) with fast pixelated detectors is a valuable
technique for rapid, spatially resolved mapping of lattice structure over a wide range of …

Mapping pure plastic strains against locally applied stress: Revealing toughening plasticity

TEJ Edwards, X Maeder, J Ast, L Berger, J Michler - Science Advances, 2022 - science.org
The deformation of all materials can be separated into elastic and plastic parts. Measuring
the purely plastic component is complex but crucial to fully characterize, understand, and …

Grain boundary strain as a determinant of localized sink efficiency

JE Nathaniel II, PK Suri, EM Hopkins, J Wen, P Baldo… - Acta Materialia, 2022 - Elsevier
The opportunity to achieve radiation tolerance in crystalline materials hinges on
understanding the structure and response of grain boundary sinks to irradiation. A common …

Optimising multi-frame ADF-STEM for high-precision atomic-resolution strain mapping

L Jones, S Wenner, M Nord, PH Ninive, OM Løvvik… - Ultramicroscopy, 2017 - Elsevier
Annular dark-field scanning transmission electron microscopy is a powerful tool to study
crystal defects at the atomic scale but historically single slow-scanned frames have been …