A tutorial introduction to research on analog and mixed-signal circuit testing

LS Milor - IEEE Transactions on Circuits and Systems II: Analog …, 1998 - ieeexplore.ieee.org
Traditionally, work on analog testing has focused on diagnosing faults in board designs.
Recently, with increasing levels of integration, not just diagnosing faults, but distinguishing …

Fault diagnosis of analog circuits

JW Bandler, AE Salama - Proceedings of the IEEE, 1985 - ieeexplore.ieee.org
In this paper, various fault location techniques in analog networks are described and
compared. The emphasis is on the more recent developments in the subject. Four main …

The analogic cellular neural network as a bionic eye

F Werblin, T Roska, LO Chua - International Journal of Circuit …, 1995 - Wiley Online Library
The conception of the CNN universal machine has led quite naturally to the invention of the
analogic CNN bionic eye (henceforth referred to simply as the bionic eye). the basic idea is …

An algorithm for soft-fault diagnosis of linear and nonlinear circuits

M Tadeusiewicz, S Halgas… - IEEE Transactions on …, 2002 - ieeexplore.ieee.org
This brief deals with soft-fault diagnosis of analog circuits. Both ac and dc linear circuits, as
well as dc nonlinear circuits with limited number of test points are considered and the …

A design-for-test methodology for active analog filters

M Soma - Proceedings. International Test Conference 1990, 1990 - ieeexplore.ieee.org
A DFT (design-for-test) methodology to improve the controllability/observability of internal
signals in active filters is presented. The normal filter design becomes an'analog …

Low-cost test of embedded RF/analog/mixed-signal circuits in SOPs

SS Akbay, A Halder, A Chatterjee… - IEEE Transactions on …, 2004 - ieeexplore.ieee.org
Increasing levels of integration and high speeds of operation have made the problem of
testing complex systems-on-packages (SOPs) very difficult. Testing packages with …

Research on ELM soft fault diagnosis of analog circuit based on KSLPP feature extraction

G Xu-Sheng, Q Hong, M Xiang-Wei, W Chun-Lan… - IEEE …, 2019 - ieeexplore.ieee.org
In order to improve the capability of soft fault diagnosis in an analog circuit, an integrated
diagnosis method based on KSLPP feature extraction and ELM is proposed. The KSLPP …

Finding ambiguity groups in low testability analog circuits

JA Starzyk, J Pang, S Manetti… - IEEE Transactions on …, 2000 - ieeexplore.ieee.org
This paper discusses a numerically efficient approach to identify complex ambiguity groups
for the purpose of analog fault diagnosis in low-testability circuits. The approach presented …

A realistic defect oriented testability methodology for analog circuits

M Sachdev - Journal of Electronic Testing, 1995 - Springer
Owing to the non-binary nature of their operation, analog circuits are influenced by process
defects in a different manner compared to digital circuits. This calls for a careful investigation …

A method for fault diagnosis in linear electronic circuits

M Tadeusiewicz, M Korzybski - International Journal of Circuit …, 2000 - Wiley Online Library
A method for fault location and parameter identification in linear AC and DC circuits with
limited accessible terminals for excitation and measurement is developed in this paper. Fault …