Integrating operations research into very large-scale integrated circuits placement design: A review

B Zhang, L Zhen, S Wang, F Yang - Asia-Pacific journal of …, 2024 - ira.lib.polyu.edu.hk
The placement stage of the physical design of very large-scale integrated circuits (VLSI)
specifies the arrangement and order of standard cells and devices within an area, and the …

Models in the Process of Designing Complex Microelectronic Objects under Conditions of Uncertainty

SE Mironov, PM Shiryaev… - 2023 XXVI International …, 2023 - ieeexplore.ieee.org
The paper is devoted to the issues of modeling objects and processes at various stages of
designing the layout of microelectronic devices. Geometric two-dimensional models of …

A Robust Two-Step Modulus-Based Matrix Splitting Iteration Method for Mixed-Size Cell Circuit Legalization Problem

CC Zhou, Y Cao, Q Shi, J Qiu - Journal of Circuits, Systems and …, 2023 - World Scientific
As semiconductor manufacturing moves into the nanotechnology era, mixed-size standard
cell circuit designs have become mainstream, but they also pose significant challenges to …

Mitigating Layout Dependent Effect-induced Timing Risk in Multi-Row-Height Detailed Placement

LC Wang, SY Fang - 2023 Design, Automation & Test in …, 2023 - ieeexplore.ieee.org
With the development of advanced process technology, the electrical characteristic variation
of MOSFET transistors has been seriously influenced by layout dependent effect (LDEs) …

Effective Legalization with Cell Version Replacement for Hybrid-Row-Height Circuit Designs

H Liu, X Bai, Z Zhu - 2024 2nd International Symposium of …, 2024 - ieeexplore.ieee.org
In traditional circuit designs, rows within the placement region typically have uniform height.
However, a novel hybrid-row-height design paradigm has recently emerged, integrating tall …

[PDF][PDF] Модели в процессе проектирования сложных микроэлектронных объектов в условиях неопределенности

СЭ Миронов, ПМ Ширяев, ОЮ Кайданович - scm.etu.ru
Статья посвящена рассмотрению вопросов моделирования объектов и процессов на
различных этапах проектирования топологии микроэлектронных устройств …