Phase and fringe order determination in wavelength scanning interferometry

G Moschetti, A Forbes, RK Leach, X Jiang… - Optics express, 2016 - opg.optica.org
A method to obtain unambiguous surface height measurements using wavelength scanning
interferometry with an improved repeatability, comparable to that obtainable using phase …

Improvement of the fringe analysis algorithm for wavelength scanning interferometry based on filter parameter optimization

T Zhang, F Gao, H Muhamedsalih, S Lou, H Martin… - Applied …, 2018 - opg.optica.org
The phase slope method which estimates height through fringe pattern frequency and the
algorithm which estimates height through the fringe phase are the fringe analysis algorithms …

Quadrature wavelength scanning interferometry

G Moschetti, A Forbes, RK Leach, X Jiang… - Applied …, 2016 - opg.optica.org
A novel method to double the measurement range of wavelength scanning interferometery
(WSI) is described. In WSI the measured optical path difference (OPD) is affected by a sign …

Development and calibration of wavelength scanning interferometry for surface topography measurement

G Moschetti - 2016 - eprints.hud.ac.uk
Modern advanced manufacturing is capable of generating complex structures on large area
substrates while maintaining high feature resolution and small defects. Examples of these …

A new method of wavelength scanning interferometry for inspecting surfaces with multi-side high-sloped facets

T Zhang - 2018 - eprints.hud.ac.uk
With the development of modern advanced manufacturing technologies, the requirements
for ultra-precision structured surfaces are increasing rapidly for both high value-added …

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