Laplace-transform deep-level spectroscopy: The technique and its applications to the study of point defects in semiconductors

L Dobaczewski, AR Peaker… - Journal of applied …, 2004 - pubs.aip.org
Thermal emission of current carriers from defects in semiconductors has been used as a
characterization technique for over 50 years. One of the most significant early publications …

[图书][B] Космическая электроника. В 2-х книгах. Книга 1

А Белоус, В Солодуха, С Шведов - 2022 - books.google.com
Книга посвящена анализу современного состояния, проблем и перспектив развития
микроэлектронной элементной базы радиоэлектронной аппаратуры ракетно …

Theory of defect levels and the “band gap problem” in silicon

PA Schultz - Physical review letters, 2006 - APS
Quantitative predictions of defect properties in semiconductors using density functional
theory have been crippled by two issues: the supercell approximation, which has incorrect …

Trivacancy and trivacancy-oxygen complexes in silicon: Experiments and ab initio modeling

VP Markevich, AR Peaker, SB Lastovskii, LI Murin… - Physical Review B …, 2009 - APS
A center from the family of “fourfold coordinated (FFC) defects”, previously predicted
theoretically, has been experimentally identified in crystalline silicon. It is shown that the …

Influence of radiation induced defect clusters on silicon particle detectors

A Junkes - 2011 - osti.gov
The Large Hadron Collider (LHC) at the European Organization for Nuclear Research
(CERN) addresses some of today's most fundamental questions of particle physics, like the …

[图书][B] Silicon, germanium, and their alloys: growth, defects, impurities, and nanocrystals

G Kissinger, S Pizzini - 2014 - books.google.com
Despite the vast knowledge accumulated on silicon, germanium, and their alloys, these
materials still demand research, eminently in view of the improvement of knowledge on …

Kinetics of divacancy annealing and divacancy-oxygen formation in oxygen-enriched high-purity silicon

M Mikelsen, EV Monakhov, G Alfieri, BS Avset… - Physical Review B …, 2005 - APS
In this work the thermal kinetics of the transformation from the divacancy (V 2) to the
divacancy-oxygen (V 2 O) complex has been studied in detail, and activation energies,(E a) …

Electronic and dynamical properties of the silicon trivacancy

J Coutinho, VP Markevich, AR Peaker, B Hamilton… - Physical Review B …, 2012 - APS
The trivacancy (V 3) in silicon has been recently shown to be a bistable center in the neutral
charge state, with a fourfold-coordinated configuration, V 3 [FFC], lower in energy than the …

Evidence for identification of the divacancy-oxygen center in Si

G Alfieri, EV Monakhov, BS Avset, BG Svensson - Physical Review B, 2003 - APS
A deep level transient spectroscopy (DLTS) study of electronic defect levels in 15 MeV
electron irradiated n-type float-zone Si samples with different oxygen contents has been …

Annealing of the divacancy-oxygen and vacancy-oxygen complexes in silicon

M Mikelsen, JH Bleka, JS Christensen… - Physical Review B …, 2007 - APS
After low dose electron irradiation, annealing kinetics of divacancy-oxygen (V 2 O) and
vacancy-oxygen (VO) complexes in carbon-lean n-type magnetic Czochralski (MCZ) and …