Si doped hafnium oxide—a “fragile” ferroelectric system

C Richter, T Schenk, MH Park… - Advanced Electronic …, 2017 - Wiley Online Library
Silicon doped hafnium oxide was the material used in the original report of ferroelectricity in
hafnia in 2011. Since then, it has been subject of many further publications including the …

Nano-composite MOx materials for NVMs

C Bonafos, L Khomenkhova, F Gourbilleau… - Metal Oxides for Non …, 2022 - Elsevier
In this chapter, we will present a digest of the main materials science aspects of the
controlled fabrication of 2D arrays of semiconducting (Si, Ge) nanocrystals (NCs) in metal …

Nanoscale evidence of erbium clustering in Er-doped silicon-rich silica

E Talbot, R Lardé, P Pareige, L Khomenkova… - Nanoscale research …, 2013 - Springer
Photoluminescence spectroscopy and atom probe tomography were used to explore the
optical activity and microstructure of Er 3+-doped Si-rich SiO 2 thin films fabricated by radio …

Solution processable amorphous hafnium silicate dielectrics and their application in oxide thin film transistors

YN Gao, YL Xu, JG Lu, JH Zhang, XF Li - Journal of Materials …, 2015 - pubs.rsc.org
Novel solution-processed amorphous high-k dielectrics for thin film transistors (TFTs) have
been systemically studied with the objective of achieving high performance and reducing …

Influence of the supersaturation on Si diffusion and growth of Si nanoparticles in silicon-rich silica

M Roussel, E Talbot, P Pareige… - Journal of Applied …, 2013 - pubs.aip.org
SiO X/SiO 2 multilayers have been prepared using magnetron sputtering and annealed in
order to induce the growth of Si nanoparticles in Si-rich sublayers. This sample has …

Microstructure and optical properties of Pr3+-doped hafnium silicate films

YT An, C Labbé, L Khomenkova, M Morales… - Nanoscale research …, 2013 - Springer
In this study, we report on the evolution of the microstructure and photoluminescence
properties of Pr 3+-doped hafnium silicate thin films as a function of annealing temperature …

The peculiarities of structural and optical properties of HfO2-based films co-doped with silicon and erbium

L Khomenkova, N Korsunska, C Labbé, X Portier… - Applied Surface …, 2019 - Elsevier
The effect of deposition conditions and further annealing treatment on microstructure and
optical properties of (Si, Er)-codoped HfO 2 thin films is investigated. The films are grown on …

Origin of Pr3+ luminescence in hafnium silicate films: combined atom probe tomography and TEM investigations

R Demoulin, G Beainy, C Castro, P Pareige… - Nano …, 2018 - iopscience.iop.org
Structural, chemical, and luminescence properties of Pr 3+-doped HfSiO x layers fabricated
by radio-frequency magnetron sputtering were examined as a function of annealing …

Transformation of photoluminescence and Raman scattering spectra of Si-rich Al2O3 films at thermal annealing

EV Hernandez, TV Torchynska, J Jedrzejewski… - Physica B: Condensed …, 2014 - Elsevier
The effect of thermal annealing on optical properties of Al 2 O 3 films with the different Si
contents was investigated using the photoluminescence and Raman scattering methods. Si …

Analysis of PL spectrum shape of Si-based materials as a tool for determination of Si crystallites׳ distribution

L Khomenkova - Physica B: Condensed Matter, 2014 - Elsevier
This paper represents the analysis of the shape of photoluminescence spectra of Si-based
nano-materials vs. energy of excitation light and temperature of measurements as a tool for …