Scatterometry—fast and robust measurements of nano-textured surfaces

MH Madsen, PE Hansen - Surface Topography: Metrology and …, 2016 - iopscience.iop.org
Scatterometry is a fast, precise and low cost way to determine the mean pitch and
dimensional parameters of periodic structures with lateral resolution of a few nanometer. It is …

Catalytic activity and stability of oxides: the role of near-surface atomic structures and compositions

Z Feng, WT Hong, DD Fong, YL Lee… - Accounts of chemical …, 2016 - ACS Publications
Conspectus Electrocatalysts play an important role in catalyzing the kinetics for oxygen
reduction and oxygen evolution reactions for many air-based energy storage and …

Advances in the atomic force microscopy for critical dimension metrology

D Hussain, K Ahmad, J Song… - Measurement Science and …, 2016 - iopscience.iop.org
Downscaling, miniaturization and 3D staking of the micro/nano devices are burgeoning
phenomena in the semiconductor industry which have posed sophisticated challenges in …

Open questions in surface topography measurement: a roadmap

R Leach, C Evans, L He, A Davies… - Surface Topography …, 2015 - iopscience.iop.org
Control of surface topography has always been of vital importance for manufacturing and
many other engineering and scientific disciplines. However, despite over one hundred years …

Measurements of CD and sidewall profile of EUV photomask structures using CD-AFM and tilting-AFM

G Dai, K Hahm, F Scholze, MA Henn… - Measurement …, 2014 - iopscience.iop.org
Accurate and traceable measurements of critical dimension (CD) and sidewall profile of
extreme ultraviolet (EUV) photomask structures using atomic force microscopes (AFMs) are …

Study on the influence of surface roughness on the diffraction efficiency of two-dimensional gratings

Y Ban, G Zhao, Z Zhang, B Chen, B Lu, H Liu - Optics Express, 2023 - opg.optica.org
This study investigates the effect of surface roughness on the diffraction efficiency of two-
dimensional gratings. Firstly, a roughness model was constructed using FDTD, followed by a …

Applicability of the Debye-Waller damping factor for the determination of the line-edge roughness of lamellar gratings

A Fernández Herrero, M Pflüger, J Probst, F Scholze… - Optics …, 2019 - opg.optica.org
Periodic nanostructures are fundamental elements in optical instrumentation as well as
basis structures in integrated electronic circuits. Decreasing sizes and increasing complexity …

Characterization of the shape and line-edge roughness of polymer gratings with grazing incidence small-angle X-ray scattering and atomic force microscopy

HS Suh, X Chen, PA Rincon-Delgadillo… - Journal of Applied …, 2016 - journals.iucr.org
Grazing-incidence small-angle X-ray scattering (GISAXS) is increasingly used for the
metrology of substrate-supported nanoscale features and nanostructured films. In the case …

Effect of sidewall roughness on the diffraction efficiency of EUV high aspect ratio freestanding transmission gratings

S Wu, J Wang, F Fang - Optics Express, 2022 - opg.optica.org
Manufacturing-induced sidewall roughness has a significant impact on the diffraction
efficiency of extreme ultraviolet (EUV) gratings and masks, which could be evaluated by a …

Bayesian approach to determine critical dimensions from scatterometric measurements

S Heidenreich, H Gross, M Bär - Metrologia, 2018 - iopscience.iop.org
Supplement one of the'Guide to the Expression of Uncertainties in Measurements
(GUM)'recommends to estimate measurement uncertainties by Monte Carlo calculations. For …