Advanced electron microscopy for advanced materials

G Van Tendeloo, S Bals, S Van Aert… - Advanced …, 2012 - Wiley Online Library
The idea of this Review is to introduce newly developed possibilities of advanced electron
microscopy to the materials science community. Over the last decade, electron microscopy …

[PDF][PDF] Advanced electron crystallography through model-based imaging

S Van Aert, A De Backer, GT Martinez, AJ Den Dekker… - IUCrJ, 2016 - journals.iucr.org
The increasing need for precise determination of the atomic arrangement of non-periodic
structures in materials design and the control of nanostructures explains the growing interest …

Bond Dissociation and Reactivity of HF and H2O in a Nano Test Tube

J Biskupek, ST Skowron, CT Stoppiello, GA Rance… - ACS …, 2020 - ACS Publications
Molecular motion and bond dissociation are two of the most fundamental phenomena
underpinning the properties of molecular materials. We entrapped HF and H2O molecules …

In-situ formation and evolution of atomic defects in monolayer WSe2 under electron irradiation

R Leiter, Y Li, U Kaiser - Nanotechnology, 2020 - iopscience.iop.org
Transition metal dichalcogenide (TMD) monolayers such as MoS 2, MoSe 2, MoTe 2, WS 2
and WSe 2 have attracted significant interest due to their remarkable electronic and optical …

[HTML][HTML] Electron beam controlled covalent attachment of small organic molecules to graphene

A Markevich, S Kurasch, O Lehtinen, O Reimer, X Feng… - Nanoscale, 2016 - pubs.rsc.org
The electron beam induced functionalization of graphene through the formation of covalent
bonds between free radicals of polyaromatic molecules and CC bonds of pristine graphene …

Electron holography for fields in solids: Problems and progress

H Lichte, F Börrnert, A Lenk, A Lubk, F Röder… - Ultramicroscopy, 2013 - Elsevier
Electron holography initially was invented by Dennis Gabor for solving the problems raised
by the aberrations of electron lenses in Transmission Electron Microscopy. Nowadays, after …

A holographic method to measure the source size broadening in STEM

J Verbeeck, A Béché, W Van den Broek - Ultramicroscopy, 2012 - Elsevier
Source size broadening is an important resolution limiting effect in modern STEM
experiments. Here, we propose an alternative method to measure the source size …

Inclusion of radiation damage dynamics in high-resolution transmission electron microscopy image simulations: The example of graphene

A Santana, A Zobelli, J Kotakoski, A Chuvilin… - Physical Review B …, 2013 - APS
Computer image simulations provide a crucial aid to high-resolution transmission electron
microscopy (HRTEM) in gaining fundamental understanding of the structure of materials …

Noise estimation for off-axis electron holography

F Röder, A Lubk, D Wolf, T Niermann - Ultramicroscopy, 2014 - Elsevier
Off-axis electron holography provides access to the phase of the elastically scattered wave
in a transmission electron microscope at scales ranging from several hundreds of …

Characterization of a Timepix detector for use in SEM acceleration voltage range

N Denisov, D Jannis, A Orekhov, K Müller-Caspary… - Ultramicroscopy, 2023 - Elsevier
Hybrid pixel direct electron detectors are gaining popularity in electron microscopy due to
their excellent properties. Some commercial cameras based on this technology are relatively …