Design and Experimental Verification of a 6.25 GHz PLL for Harsh Temperature Conditions in 65 nm CMOS Technology

M Mestice, G Ciarpi, D Rossi… - IEEE Transactions on …, 2024 - ieeexplore.ieee.org
Reliability is an important characteristic of electronic systems, and it could be undermined by
several issues. Among these, wide temperature range represents a threat for the correct …