Topological electronics

MJ Gilbert - Communications Physics, 2021 - nature.com
Within the broad and deep field of topological materials, there are an ever-increasing
number of materials that harbor topological phases. While condensed matter physics …

[HTML][HTML] Opportunities and challenges of 2D materials in back-end-of-line interconnect scaling

CL Lo, BA Helfrecht, Y He, DM Guzman… - Journal of Applied …, 2020 - pubs.aip.org
As the challenges in continued scaling of the integrated circuit technology escalate every
generation, there is an urgent need to find viable solutions for both the front-end-of-line …

[HTML][HTML] Electron mean free path in elemental metals

D Gall - Journal of applied physics, 2016 - pubs.aip.org
The electron mean free path λ and carrier relaxation time τ of the twenty most conductive
elemental metals are determined by numerical integration over the Fermi surface obtained …

[HTML][HTML] The search for the most conductive metal for narrow interconnect lines

D Gall - Journal of Applied Physics, 2020 - pubs.aip.org
A major challenge for the continued downscaling of integrated circuits is the resistivity
increase of Cu interconnect lines with decreasing dimensions. Alternative metals have the …

[HTML][HTML] Nanoscale thermal transport. II. 2003–2012

DG Cahill, PV Braun, G Chen, DR Clarke… - Applied physics …, 2014 - pubs.aip.org
A diverse spectrum of technology drivers such as improved thermal barriers, higher
efficiency thermoelectric energy conversion, phase-change memory, heat-assisted magnetic …

Metal nanowire networks: the next generation of transparent conductors

S Ye, AR Rathmell, Z Chen, IE Stewart… - Advanced …, 2014 - Wiley Online Library
There is an ongoing drive to replace the most common transparent conductor, indium tin
oxide (ITO), with a material that gives comparable performance, but can be coated from …

Understanding grain boundary electrical resistivity in Cu: the effect of boundary structure

H Bishara, S Lee, T Brink, M Ghidelli, G Dehm - ACS nano, 2021 - ACS Publications
Grain boundaries (GBs) in metals usually increase electrical resistivity due to their distinct
atomic arrangement compared to the grain interior. While the GB structure has a crucial …

Enhanced electrical and thermal conduction in graphene-encapsulated copper nanowires

R Mehta, S Chugh, Z Chen - Nano letters, 2015 - ACS Publications
Highly conductive copper nanowires (CuNWs) are essential for efficient data transfer and
heat conduction in wide ranging applications like high-performance semiconductor chips …

Thickness dependence of the resistivity of platinum-group metal thin films

S Dutta, K Sankaran, K Moors, G Pourtois… - Journal of Applied …, 2017 - pubs.aip.org
We report on the thin film resistivity of several platinum-group metals (Ru, Pd, Ir, and Pt).
Platinum-group thin films show comparable or lower resistivities than Cu for film thicknesses …

Electron scattering at surfaces and grain boundaries in Cu thin films and wires

JS Chawla, F Gstrein, KP O'Brien, JS Clarke… - Physical Review B …, 2011 - APS
The electron scattering at surfaces, interfaces, and grain boundaries is investigated using
polycrystalline and single-crystal Cu thin films and nanowires. The experimental data is …