High-K materials and metal gates for CMOS applications

J Robertson, RM Wallace - Materials Science and Engineering: R: Reports, 2015 - Elsevier
The scaling of complementary metal oxide semiconductor (CMOS) transistors has led to the
silicon dioxide layer used as a gate dielectric becoming so thin that the gate leakage current …

Crystallinity of inorganic films grown by atomic layer deposition: Overview and general trends

V Miikkulainen, M Leskelä, M Ritala… - Journal of Applied …, 2013 - pubs.aip.org
Atomic layer deposition (ALD) is gaining attention as a thin film deposition method, uniquely
suitable for depositing uniform and conformal films on complex three-dimensional …

Area-selective deposition: fundamentals, applications, and future outlook

GN Parsons, RD Clark - Chemistry of Materials, 2020 - ACS Publications
This review provides an overview of area-selective thin film deposition (ASD) with a primary
focus on vapor-phase thin film formation via chemical vapor deposition (CVD) and atomic …

The use of atomic layer deposition in advanced nanopatterning

AJM Mackus, AA Bol, WMM Kessels - Nanoscale, 2014 - pubs.rsc.org
Atomic layer deposition (ALD) is a method that allows for the deposition of thin films with
atomic level control of the thickness and an excellent conformality on 3-dimensional …

Surface chemistry of atomic layer deposition: A case study for the trimethylaluminum/water process

RL Puurunen - Journal of applied physics, 2005 - pubs.aip.org
Atomic layer deposition (ALD), a chemical vapor deposition technique based on sequential
self-terminating gas–solid reactions, has for about four decades been applied for …

High dielectric constant oxides

J Robertson - The European Physical Journal-Applied Physics, 2004 - cambridge.org
The scaling of complementary metal oxide semiconductor (CMOS) transistors has led to the
silicon dioxide layer used as a gate dielectric becoming so thin (1.4 nm) that its leakage …

High dielectric constant gate oxides for metal oxide Si transistors

J Robertson - Reports on progress in Physics, 2005 - iopscience.iop.org
The scaling of complementary metal oxide semiconductor transistors has led to the silicon
dioxide layer, used as a gate dielectric, being so thin (1.4 nm) that its leakage current is too …

Island growth as a growth mode in atomic layer deposition: A phenomenological model

RL Puurunen, W Vandervorst - Journal of Applied Physics, 2004 - pubs.aip.org
Atomic layer deposition (ALD) has within the past few years received world-wide attention
for manufacturing conformal material layers with thickness in the nanometer range …

Interface engineering of high efficiency perovskite solar cells based on ZnO nanorods using atomic layer deposition

S Li, P Zhang, Y Wang, H Sarvari, D Liu, J Wu, Y Yang… - Nano Research, 2017 - Springer
Despite the considerably improved efficiency of inorganic–organic metal hybrid perovskite
solar cells (PSCs), electron transport is still a challenging issue. In this paper, we report the …

Thermal Atomic Layer Etching of SiO2 by a “Conversion-Etch” Mechanism Using Sequential Reactions of Trimethylaluminum and Hydrogen Fluoride

JW DuMont, AE Marquardt, AM Cano… - ACS applied materials …, 2017 - ACS Publications
The thermal atomic layer etching (ALE) of SiO2 was performed using sequential reactions of
trimethylaluminum (TMA) and hydrogen fluoride (HF) at 300° C. Ex situ X-ray reflectivity …