High-K materials and metal gates for CMOS applications
J Robertson, RM Wallace - Materials Science and Engineering: R: Reports, 2015 - Elsevier
The scaling of complementary metal oxide semiconductor (CMOS) transistors has led to the
silicon dioxide layer used as a gate dielectric becoming so thin that the gate leakage current …
silicon dioxide layer used as a gate dielectric becoming so thin that the gate leakage current …
Crystallinity of inorganic films grown by atomic layer deposition: Overview and general trends
V Miikkulainen, M Leskelä, M Ritala… - Journal of Applied …, 2013 - pubs.aip.org
Atomic layer deposition (ALD) is gaining attention as a thin film deposition method, uniquely
suitable for depositing uniform and conformal films on complex three-dimensional …
suitable for depositing uniform and conformal films on complex three-dimensional …
Area-selective deposition: fundamentals, applications, and future outlook
GN Parsons, RD Clark - Chemistry of Materials, 2020 - ACS Publications
This review provides an overview of area-selective thin film deposition (ASD) with a primary
focus on vapor-phase thin film formation via chemical vapor deposition (CVD) and atomic …
focus on vapor-phase thin film formation via chemical vapor deposition (CVD) and atomic …
The use of atomic layer deposition in advanced nanopatterning
Atomic layer deposition (ALD) is a method that allows for the deposition of thin films with
atomic level control of the thickness and an excellent conformality on 3-dimensional …
atomic level control of the thickness and an excellent conformality on 3-dimensional …
Surface chemistry of atomic layer deposition: A case study for the trimethylaluminum/water process
RL Puurunen - Journal of applied physics, 2005 - pubs.aip.org
Atomic layer deposition (ALD), a chemical vapor deposition technique based on sequential
self-terminating gas–solid reactions, has for about four decades been applied for …
self-terminating gas–solid reactions, has for about four decades been applied for …
High dielectric constant oxides
J Robertson - The European Physical Journal-Applied Physics, 2004 - cambridge.org
The scaling of complementary metal oxide semiconductor (CMOS) transistors has led to the
silicon dioxide layer used as a gate dielectric becoming so thin (1.4 nm) that its leakage …
silicon dioxide layer used as a gate dielectric becoming so thin (1.4 nm) that its leakage …
High dielectric constant gate oxides for metal oxide Si transistors
J Robertson - Reports on progress in Physics, 2005 - iopscience.iop.org
The scaling of complementary metal oxide semiconductor transistors has led to the silicon
dioxide layer, used as a gate dielectric, being so thin (1.4 nm) that its leakage current is too …
dioxide layer, used as a gate dielectric, being so thin (1.4 nm) that its leakage current is too …
Island growth as a growth mode in atomic layer deposition: A phenomenological model
RL Puurunen, W Vandervorst - Journal of Applied Physics, 2004 - pubs.aip.org
Atomic layer deposition (ALD) has within the past few years received world-wide attention
for manufacturing conformal material layers with thickness in the nanometer range …
for manufacturing conformal material layers with thickness in the nanometer range …
Interface engineering of high efficiency perovskite solar cells based on ZnO nanorods using atomic layer deposition
Despite the considerably improved efficiency of inorganic–organic metal hybrid perovskite
solar cells (PSCs), electron transport is still a challenging issue. In this paper, we report the …
solar cells (PSCs), electron transport is still a challenging issue. In this paper, we report the …
Thermal Atomic Layer Etching of SiO2 by a “Conversion-Etch” Mechanism Using Sequential Reactions of Trimethylaluminum and Hydrogen Fluoride
JW DuMont, AE Marquardt, AM Cano… - ACS applied materials …, 2017 - ACS Publications
The thermal atomic layer etching (ALE) of SiO2 was performed using sequential reactions of
trimethylaluminum (TMA) and hydrogen fluoride (HF) at 300° C. Ex situ X-ray reflectivity …
trimethylaluminum (TMA) and hydrogen fluoride (HF) at 300° C. Ex situ X-ray reflectivity …