Refurbished chips (ie, chips re-used legally in circular economy) and counterfeited chips (ie,
used chips fraudulently sold as new) are a growing concern for the industry because of their …

This work reports an on-chip heater structure fabricated in the Front End of Line (FEOL) on a
versatile ring-oscillator (RO) array utilized to conduct statistical characterization of on-chip …

This article presents a new methodology to extract, at a given operation condition, the
statistical distribution of the number of active defects that contribute to the observed device …

With tightening reliability margins, product-level aging analysis is gradually gaining impetus
and is set to become an integral part of the modern design flow. Increased emphasis is …

This article reports a test chip design in commercial 40-nm process technology to
characterize the level of time-based degradation in metal-oxide-semiconductor field-effect …

Abstract Random Telegraph Noise (RTN) has attracted increasing interest in the last years.
This phenomenon introduces variability in the electrical properties of transistors, in particular …

Shrinking reliability margins have created an increasing demand for circuit aging
simulations, which enable product reliability assessment pre-production. Physical Design …

In the past few years, Time-Dependent Variability has become a subject of growing concern
in CMOS technologies. In particular, phenomena such as Bias Temperature Instability, Hot …

The reliability and durability of integrated circuits (ICs), present in almost every electronic
system, from consumer electronics to the automotive or aerospace industries, have been …

In nowadays deeply scaled CMOS technologies, time-zero and time-dependent variability
effects have become important concerns for analog and digital circuit design. For instance …