Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard
analytical technique used in the transmission electron microscope to extract chemical and …

The status of research on carbon nitride compounds is reviewed including exciting recent
results. On the basis of the early theoretical predictions by Cohen and co-workers in 1985 …

CN x films were found to have a distorted graphitelike microstructure consisting of buckled
and curved basal planes using high-resolution electron microscopy. Nanoindentation …

Si nanowires grow rapidly by chemical vapor deposition on Ti-containing islands on Si
surfaces when an abundant supply of Si-containing gaseous precursor is available. The …

All techniques employed in the preparation of samples for transmission electron microscopy
(TEM) introduce or include artifacts that can degrade the images of the materials being …

Silicon dioxide films grown by industrial thermal furnace, rapid thermal, and low-pressure
thermal methods were measured by x-ray photoelectron spectroscopy, transmission electron …

Multiple layers of Si quantum dots (QDs) in SiO2 with a narrow size distribution were
synthesized by a co-sputtering technique. Structural, electrical and optical properties of Si …

The effects of the stoichiometry of the Si-rich oxide (SRO) layer, O/Si ratio, on the structural
and optical properties of SRO/SiO 2 multilayer films were investigated in this work. SRO/SiO …

Scanning Probe Microscopes: Applications in Science and Technology explains, analyzes,
and demonstrates the most widely used microscope in the family of microscopes--the …

Doping of Si quantum dots is important in the field of Si quantum dots-based solar cells.
Structural, optical and electrical properties of Si QDs formed as multilayers in a SiO2 matrix …