This review is intended to account for the experimental and theoretical achievements
obtained in a period of about 15 years on the investigation of the electron transport through …

Atomic force microscopy (AFM) is a key tool for nanotechnology research and finds its
principal application in the determination of surface topography. However, the use of the …

We present a procedure for calibrated complex impedance measurements and dielectric
quantification with scanning microwave microscopy. The calibration procedure works in situ …

This review attempts to recount, from my perspective, some of the science and technology
highlights (and pitfalls) that fueled the nanoscience and nanotechnology revolution—an …

An overview of the existing two-dimensional carrier profiling tools using scanning probe
microscopy includes several scanning tunneling microscopy modes, scanning capacitance …

A current detection scanning probe technique is developed that quantifies frequency-
dependent local transport properties. The approach, referred to as nanoimpedance …

We argue that interaction between molecules and substrate is a key parameter which
determines the conducting or insulating behavior of DNA molecules. In this letter, we show …

Scanning spreading resistance microscopy (SSRM) is a powerful method for the
characterization of Si semiconductor devices based on atomic force microscopy (AFM). It …

Obtaining quantitative electrical information with scanning probe microscopy techniques
poses a significant challenge since the nature of the probe/sample contact is frequently …

Self-organized epitaxial nanorods, obtained by an adapted annealing process after
deposition of metallic strontium vanadate perovskite (SrVO 3) thin films, are analyzed to …