GaN integration technology, an ideal candidate for high-temperature applications: A review

A Hassan, Y Savaria, M Sawan - IEEE Access, 2018 - ieeexplore.ieee.org
In many leading industrial applications such as aerospace, military, automotive, and deep-
well drilling, extreme temperature environment is the fundamental hindrance to the use of …

A comprehensive review for micro/nanoscale thermal mapping technology based on scanning thermal microscopy

Y Li, Y Zhang, Y Liu, H Xie, W Yu - Journal of Thermal Science, 2022 - Springer
Thermal characterization becomes challenging as the material size is reduced to
micro/nanoscales. Based on scanning probe microscopy (SPM), scanning thermal …

Electrothermal simulation and thermal performance study of GaN vertical and lateral power transistors

Y Zhang, M Sun, Z Liu, D Piedra, HS Lee… - IEEE transactions on …, 2013 - ieeexplore.ieee.org
In this paper, we present self-consistent electrothermal simulations of single-finger and
multifinger GaN vertical metal-oxide-semiconductor field-effect transistors (MOSFETs) and …

An electrothermal model for AlGaN/GaN power HEMTs including trapping effects to improve large-signal simulation results on high VSWR

O Jardel, F De Groote, T Reveyrand… - IEEE Transactions …, 2007 - ieeexplore.ieee.org
A large-signal electrothermal model for AlGaN/GaN HEMTs including gate and drain related
trapping effects is proposed here. This nonlinear model is well formulated to preserve …

Comparison of GaN HEMTs on diamond and SiC substrates

JG Felbinger, MVS Chandra, Y Sun… - IEEE Electron …, 2007 - ieeexplore.ieee.org
The performance of AlGaN/GaN high-electron-mobility transistors (HEMTs) on diamond and
SiC substrates is examined. We demonstrate GaN-on-diamond transistors with periphery …

AlGaN/GaN HFET reliability

RJ Trew, DS Green, JB Shealy - IEEE Microwave magazine, 2009 - ieeexplore.ieee.org
High-voltage AlGaN/GaN HFETs can produce high RF output power with nearly ideal power-
added efficiency. But widespread adoption of these HFETs has been limited by a lack of …

Channel temperature analysis of GaN HEMTs with nonlinear thermal conductivity

A Darwish, AJ Bayba, HA Hung - IEEE Transactions on electron …, 2015 - ieeexplore.ieee.org
This paper presents an enhanced, closed-form expression for the thermal resistance, and
thus, the channel temperature of AlGaN/gallium nitride (GaN) HEMTs, including the effect of …

Channel temperature determination in high-power AlGaN/GaN HFETs using electrical methods and Raman spectroscopy

RJT Simms, JW Pomeroy, MJ Uren… - … on Electron Devices, 2008 - ieeexplore.ieee.org
Self-heating in AlGaN/GaN HFETs was investigated using electrical analysis and micro-
Raman thermography. Two typically employed electrical methods were assessed to provide …

Temperature-dependent characterization of AlGaN/GaN HEMTs: Thermal and source/drain resistances

R Menozzi, GA Umana-Membreno… - … on Device and …, 2008 - ieeexplore.ieee.org
This paper shows the application of simple dc techniques to the temperature-dependent
characterization of AlGaN/GaN HEMTs in terms of the following: 1) thermal resistance and 2) …

Simple and accurate method to estimate channel temperature and thermal resistance in AlGaN/GaN HEMTs

S Martin-Horcajo, A Wang, MF Romero… - … on Electron Devices, 2013 - ieeexplore.ieee.org
Self-heating effects in AlGaN/GaN high-electron mobility transistors grown on three different
substrates have been evaluated for ambient temperatures between 0° C and 225° C. A …