Recent developments in p‐Type oxide semiconductor materials and devices

Z Wang, PK Nayak, JA Caraveo‐Frescas… - Advanced …, 2016 - Wiley Online Library
The development of transparent p‐type oxide semiconductors with good performance may
be a true enabler for a variety of applications where transparency, power efficiency, and …

Materials and applications for large area electronics: solution-based approaches

AC Arias, JD MacKenzie, I McCulloch, J Rivnay… - Chemical …, 2010 - ACS Publications
In its most compelling forms, large area electronics addresses a range of applications
outside those where monocrystalline Si and III-V integration are used, or it approaches those …

Multimode transistors and neural networks based on ion-dynamic capacitance

X Liang, Y Luo, Y Pei, M Wang, C Liu - Nature Electronics, 2022 - nature.com
Electrolyte-gated transistors can function as switching elements, artificial synapses and
memristive systems, and could be used to create compact and powerful neuromorphic …

Reliability of organic field‐effect transistors

H Sirringhaus - Advanced Materials, 2009 - Wiley Online Library
In this article, we review current understanding of the reliability of organic field‐effect
transistors, with a particular focus on degradation of device characteristics under bias stress …

Bias‐stress‐induced stretched‐exponential time dependence of charge injection and trapping in amorphous thin‐film transistors

FR Libsch, J Kanicki - Applied Physics Letters, 1993 - pubs.aip.org
The threshold voltage instabilities in nitride/oxide dual gate dielectric hydrogenated
amorphous silicon (u-Si: H) thin-film transistors are investigated as a function of stress time …

Field-effect transistors made from solution-processed organic semiconductors

AR Brown, CP Jarrett, DM De Leeuw, M Matters - Synthetic metals, 1997 - Elsevier
We present results on metal-insulator-semiconductor field-effect transistors using
conjugated organic semiconductors which can be processed from solution. The polymer …

Structural relaxation and defect annihilation in pure amorphous silicon

S Roorda, WC Sinke, JM Poate, DC Jacobson… - Physical review B, 1991 - APS
Thick amorphous Si layers have been prepared by MeV self-ion-implantation and the
thermodynamic and structural properties examined by calorimetry, Raman-spectroscopy …

Organic small molecule field-effect transistors with Cytop™ gate dielectric: Eliminating gate bias stress effects

WL Kalb, T Mathis, S Haas, AF Stassen… - Applied Physics …, 2007 - pubs.aip.org
Organic field-effect transistors with unprecedented resistance against gate bias stress are
described. The single crystal and thin-film transistors employ the organic gate dielectric …

25th anniversary article: microstructure dependent bias stability of organic transistors

WH Lee, HH Choi, DH Kim, K Cho - Advanced Materials, 2014 - Wiley Online Library
Recent studies of the bias‐stress‐driven electrical instability of organic field‐effect
transistors (OFETs) are reviewed. OFETs are operated under continuous gate and …

Defect pool in amorphous-silicon thin-film transistors

MJ Powell, C Van Berkel, AR Franklin, SC Deane… - Physical Review B, 1992 - APS
Amorphous-silicon thin-film transistors show a threshold voltage shift when subjected to
prolonged bias stress. For transistors made with silicon oxide as the gate dielectric, the …