Quadruple and sextuple cross-coupled SRAM cell designs with optimized overhead for reliable applications
Aggressive technology scaling makes modern advanced SRAMs more and more vulnerable
to soft errors such as single-node upsets (SNUs) and double-node upsets (DNUs). This …
to soft errors such as single-node upsets (SNUs) and double-node upsets (DNUs). This …
Novel speed-and-power-optimized SRAM cell designs with enhanced self-recoverability from single-and double-node upsets
The continuous advancement of CMOS technologies makes SRAMs more and more
sensitive to soft errors. This paper presents two novel radiation-hardened SRAM cell …
sensitive to soft errors. This paper presents two novel radiation-hardened SRAM cell …
Two double-node-upset-hardened flip-flop designs for high-performance applications
The continuous advancement of complementary metal-oxide-semiconductor technologies
makes flip-flops (FFs) vulnerable to soft errors. Single-node upsets (SNUs), as well as …
makes flip-flops (FFs) vulnerable to soft errors. Single-node upsets (SNUs), as well as …
[HTML][HTML] Open-source IP cores for space: A processor-level perspective on soft errors in the RISC-V era
This paper discusses principles and techniques to evaluate processors for dependable
computing in space applications. The focus is on soft errors, which dominate the failure rate …
computing in space applications. The focus is on soft errors, which dominate the failure rate …
Cost-effective and highly reliable circuit-components design for safety-critical applications
A Yan, Z Fan, L Ding, J Cui, Z Huang… - … on Aerospace and …, 2021 - ieeexplore.ieee.org
With the reduction of technology nodes now reaching 2 nm, circuits become increasingly
susceptible to external perturbations. Thereby, soft errors, such as single-node-upset (SNU) …
susceptible to external perturbations. Thereby, soft errors, such as single-node-upset (SNU) …
Characterizing SRAM and FF soft error rates with measurement and simulation
M Hashimoto, K Kobayashi, J Furuta, SI Abe… - Integration, 2019 - Elsevier
Soft error originating from cosmic ray is a serious concern for reliability demanding
applications, such as autonomous driving, supercomputer, and public transportation system …
applications, such as autonomous driving, supercomputer, and public transportation system …
A soft-error-immune quadruple-node-upset tolerant latch
Z Huang, L Duan, Y Zhang, T Ni… - IEEE Transactions on …, 2022 - ieeexplore.ieee.org
With the continuous technology scaling of integrated circuits, storage devices are more and
more easily affected by soft errors. In order to improve the reliability of storage devices and …
more easily affected by soft errors. In order to improve the reliability of storage devices and …
Thales: Formulating and estimating architectural vulnerability factors for dnn accelerators
As Deep Neural Networks (DNNs) are increasingly deployed in safety critical and privacy
sensitive applications such as autonomous driving and biometric authentication, it is critical …
sensitive applications such as autonomous driving and biometric authentication, it is critical …
Energy-efficient radiation hardened SRAM cell for low voltage terrestrial applications
The static random access memory (SRAM) cells are essential for aerospace applications in
near sub-threshold voltage, and it has challenges for the implementation of SRAM cells for …
near sub-threshold voltage, and it has challenges for the implementation of SRAM cells for …
Dual-modular-redundancy and dual-level error-interception based triple-node-upset tolerant latch designs for safety-critical applications
This paper presents a dual-modular-redundancy and dual-level error-interception based
triple-node-upset (TNU) tolerant latch design (namely DDETT) for safety-critical applications …
triple-node-upset (TNU) tolerant latch design (namely DDETT) for safety-critical applications …