Nitrogen-rich transition metal nitrides

A Salamat, AL Hector, P Kroll, PF McMillan - Coordination Chemistry …, 2013 - Elsevier
The solid state chemistry leading to the synthesis and characterization of metal nitrides with
N: M ratios> 1 is summarized. Studies of these compounds represent an emerging area of …

Influence of nitrogen concentration on electrical, mechanical, and structural properties of tantalum nitride thin films prepared via DC magnetron sputtering

D Dastan, K Shan, A Jafari, F Gity, XT Yin, Z Shi… - Applied Physics A, 2022 - Springer
Tantalum nitride thin films are grown on silicon wafers using a mixture of Ar/N2 using DC
magnetron sputtering. The influence of nitrogen concentration on various features of …

Influence of the nitrogen content on the structure and properties of MoNbTaVW high entropy alloy thin films

A Xia, R Dedoncker, O Glushko, MJ Cordill… - Journal of alloys and …, 2021 - Elsevier
The influence of nitrogen incorporation on the chemical composition, structure, mechanical,
and electrical properties of refractory (MoNbTaVW) 1− x N x high entropy alloy thin films is …

A review on electrocatalytic activities, phase stabilities, spectroscopic advancements, and photocorrosion in Ta-N phases

RS Mukkavilli, N Moharana, B Singh, T Fischer… - Nano Energy, 2024 - Elsevier
The search for sustainable energy solutions has led to extensive research on new
electrocatalysts that can convert electrical energy into chemical energy and back. Tantalum …

Tantalum nitride atomic layer deposition using (tert-butylimido) tris (diethylamido) tantalum and hydrazine

BB Burton, AR Lavoie, SM George - Journal of the …, 2008 - iopscience.iop.org
Tantalum nitride atomic layer deposition (ALD) was performed using sequential exposures
of (tert-butylimido) tris (diethylamido) tantalum (TBTDET) and either hydrazine or ammonia …

Control of electrical resistivity of TaN thin films by reactive sputtering for embedded passive resistors

SM Kang, SG Yoon, SJ Suh, DH Yoon - Thin Solid Films, 2008 - Elsevier
Tantalum nitride thin films were deposited by radio frequency (RF) reactive sputtering at
various N2/Ar gas flow ratios and working pressures to examine the change of their …

Effect of nitrogen flow ratio on nano-mechanical properties of tantalum nitride thin film

SS Firouzabadi, M Naderi, K Dehghani… - Journal of Alloys and …, 2017 - Elsevier
In this research, nanostructured tantalum nitride (TaN) thin films were deposited on 316L
stainless steel substrates by reactive magnetron sputtering. The effect of nitrogen flow ratio …

Fabrication of BaTaO2N Thin Films by Interfacial Reactions of BaCO3/Ta3N5 Layers on a Ta Substrate and Resulting High Photoanode Efficiencies During Water …

S Nishimae, Y Mishima, H Nishiyama, Y Sasaki… - Solar …, 2020 - Wiley Online Library
Thin films of barium tantalum oxynitride (BaTaO2N) with thicknesses of 150–680 nm are
grown on TaN/Ta substrates via the interfacial reaction of BaCO3/Ta3N5 layers in a N2 …

The impact of substrate properties and thermal annealing on tantalum nitride thin films

M Grosser, M Münch, H Seidel, C Bienert… - Applied surface …, 2012 - Elsevier
In this study film properties of sputter-deposited tantalum nitride (TaNx) thin layers are
investigated focusing on the impact of substrate properties, varying nitrogen content for film …

Properties of tantalum oxynitride thin films produced by magnetron sputtering: The influence of processing parameters

D Cristea, D Constantin, A Crisan, CS Abreu… - Vacuum, 2013 - Elsevier
The main purpose of this work is to present and to interpret the change of structure and
physical properties of tantalum oxynitride (TaN x O y) thin films, produced by dc reactive …