Design of broadband high-efficiency superconducting-nanowire single photon detectors
L Redaelli, G Bulgarini, S Dobrovolskiy… - Superconductor …, 2016 - iopscience.iop.org
In this paper several designs to maximize the absorption efficiency of superconducting-
nanowire single-photon detectors are investigated. Using a simple optical cavity consisting …
nanowire single-photon detectors are investigated. Using a simple optical cavity consisting …
Time-integrated photon emission as a function of temperature in 32 nm CMOS
AB Shehata, AJ Weger, F Stellari… - 2015 IEEE …, 2015 - ieeexplore.ieee.org
This work presents a study of the effect of chip temperature on Photon Emission Microscopy
(PEM) images acquired with an extended sensitivity near-infrared camera. A detailed …
(PEM) images acquired with an extended sensitivity near-infrared camera. A detailed …
Laser-Based, Photon, and Thermal Emission
VK Ravikumar, K Dickson, C Boit - 2023 - dl.asminternational.org
This chapter assesses the capabilities and limitations of electric fault isolation (EFI)
technology, the measurement challenges associated with new device architectures, and the …
technology, the measurement challenges associated with new device architectures, and the …
Tuning of superconducting nanowire single-photon detector parameters for VLSI circuit testing using time-resolved emission
AB Shehata, F Stellari - Quantum Sensing and Nanophotonic …, 2015 - spiedigitallibrary.org
Time-Resolved Emission (TRE) is a truly non-invasive technique based on the detection of
intrinsic light emitted by integrated circuits that is used for the detection of timing related …
intrinsic light emitted by integrated circuits that is used for the detection of timing related …
Automated emission data registration and segmentation for IC analysis
F Stellari, P Song - International Symposium for Testing and …, 2016 - dl.asminternational.org
In this paper, the development of advanced emission data analysis methodologies for IC
debugging and characterization is discussed. Techniques for automated layout to emission …
debugging and characterization is discussed. Techniques for automated layout to emission …
Spontaneous photon emission from 32 nm and 14 nm SOI FETs
The very faint spontaneous near-infrared photon emission of scaled SOI FETs fabricated in
32 nm planar and 14 nm FinFET technologies is characterized and modeled for the first time …
32 nm planar and 14 nm FinFET technologies is characterized and modeled for the first time …
High absorption efficiency and polarization-insensitivity in superconducting-nanowire single-photon detectors
L Redaelli, G Bulgarini, S Dobrovolskiy… - … Sensing and Nano …, 2017 - spiedigitallibrary.org
The performance of superconducting-nanowire single-photon detectors depends on the
efficiency of light absorption in the ultrathin (3-8 nm) superconducting nanowire. In this work …
efficiency of light absorption in the ultrathin (3-8 nm) superconducting nanowire. In this work …
SUPERCONDUCTING SINGLE-PHOTON DETECTOR ENABLES TIME-RESOLVED EMISSION TESTING OF LOW-VOLTAGE SCALED ICs.
The article discusses the relevance of superconducting single-photon detector as a time-
resolved emission technique used for the accurate localization of failures of the probing …
resolved emission technique used for the accurate localization of failures of the probing …
Effect of temperature on superconducting nanowire single-photon detector noise
Today Superconducting Nanowire Single-Photon Detectors (SNSPDs) are commonly used
in different photon-starved applications, including testing and diagnostics of VLSI circuits …
in different photon-starved applications, including testing and diagnostics of VLSI circuits …