The grand challenges of plasma etching: a manufacturing perspective

CGN Lee, KJ Kanarik, RA Gottscho - Journal of Physics D …, 2014 - iopscience.iop.org
Plasma etching has been enabling nano-electronic fabrication since the 1980s; during this
time, transistor size has shrunk by nearly two orders of magnitude, starting at 1.0 µm in the …

Review on vacuum ultraviolet generation in low‐pressure plasmas

D Popović, M Mozetič, A Vesel, G Primc… - Plasma processes …, 2021 - Wiley Online Library
Low‐pressure nonequilibrium plasmas can be a source of intense radiation in the vacuum
ultraviolet (VUV) range which can play an important role in the surface modification of solid …

Photo-initiated chemical vapor deposition as a scalable particle functionalization technology (a practical review)

CAD Dion, JR Tavares - Powder technology, 2013 - Elsevier
Chemical vapor deposition (CVD), and its variants, is a more viable technology than the
addition of surface active agents to modify nanoparticle surfaces. While thermally-activated …

Controlling VUV photon fluxes in pulsed inductively coupled Ar/Cl2 plasmas and potential applications in plasma etching

P Tian, MJ Kushner - Plasma Sources Science and Technology, 2017 - iopscience.iop.org
UV/VUV photon fluxes in plasma materials processing have a variety of effects ranging from
producing damage to stimulating synergistic reactions. Although in plasma etching …

Unbiased line width roughness measurements with critical dimension scanning electron microscopy and critical dimension atomic force microscopy

L Azarnouche, E Pargon, K Menguelti… - Journal of Applied …, 2012 - pubs.aip.org
With the constant decrease of semiconductor device dimensions, line width roughness
(LWR) becomes one of the most important sources of device variability and thus needs to be …

Ready for multi-beam exposure at 5kV on MAPPER tool: lithographic and process integration performances of advanced resists/stack

I Servin, NA Thiam, P Pimenta-Barros… - Alternative …, 2015 - spiedigitallibrary.org
Maskless electron beam lithography is an attractive solution to address sub-90 nm
technology nodes with high throughput and manufacturing costs reduction. One of the key …

Benefits of plasma treatments on critical dimension control and line width roughness transfer during gate patterning

L Azarnouche, E Pargon, K Menguelti… - Journal of Vacuum …, 2013 - pubs.aip.org
The present work focuses on the line width roughness (LWR) transfer and the critical
dimension control during a typical gate stack patterning and shows the benefits of …

Vacuum-ultraviolet promoted oxidative micro photoetching of graphene oxide

Y Tu, T Utsunomiya, T Ichii… - ACS Applied Materials & …, 2016 - ACS Publications
Microprocessing of graphene oxide (GO) films is of fundamental importance in fabricating
graphene-based devices. We demonstrate the photoetching of GO sheets using vacuum …

Determination of the excited argon states densities in high-frequency capacitive discharge

AS Kovalev, KA Kurchikov, OV Proshina… - Physics of …, 2019 - pubs.aip.org
An experimental measurement of the density of excited argon states 1s5, 1s4, 1s3, and 1s2
was carried out for an rf capacitive discharge in argon at a frequency of 13.56 MHz and 81 …

Improvement of sidewall roughness of sub-micron silicon-on-insulator waveguides for low-loss on-chip links

C Bellegarde, E Pargon, C Sciancalepore… - Silicon …, 2017 - spiedigitallibrary.org
We report the successful fabrication of low-loss sub-micrometric Silicon-On-Insulator strip
waveguides for on-chips links. Several strategies including post-lithography treatment, and …