Recent research has led to a deeper understanding of the nature and consequences of
interactions of materials on an atomic scale. The results have resonated throughout the field …

Scanning probe microscopes, in particular the atomic force microscope (AFM), have
developed into sophisticated instruments that, throughout the world, are no longer used just …

Nanotechnology is the science of understanding matter and the control of matter at
dimensions of 100 nm or less. Encompassing nanoscale science, engineering, and …

To the extent that tips are not perfectly sharp, images produced by scanned probe
microscopies (SPM) such as atomic force microscopy and scanning tunneling microscopy …

Metrology and Properties of Engineering Surfaces provides in a single volume a
comprehensive and authoritative treatment of the crucial topics involved in the metrology …

Paper, a man-made material that has been used for hundreds of years, is a network of
natural cellulosic fibres. To a large extent, it is the strength of bonding between these …

Precision measurements of 240 nm-pitch one-dimensional grating standards were carried
out using an atomic force microscope (AFM) with a high-resolution three-axis laser …

An atomic force microscope with a high-resolution three-axis laser interferometer for real-
time correction of distorted topographic images has been constructed and investigated. With …

Nanometre accuracy and resolution metrology over technically relevant areas is becoming a
necessity for the progress of nanomanufacturing. At the National Institute of Standards and …

A metrological atomic force microscope (mAFM) has been developed at LNE. It will be
dedicated to traceable dimensional measurements and calibrations of transfer standards …