High-frequency and noise performances of 65-nm MOSFET at liquid nitrogen temperature
A Siligaris, G Pailloncy, S Delcourt… - … on Electron Devices, 2006 - ieeexplore.ieee.org
In this paper, the high-frequency properties of MOSFETs at low-temperature operation are
investigated through measurements and electrical simulations. The experimental results …
investigated through measurements and electrical simulations. The experimental results …
Microwave and noise performance of SiGe BiCMOS HBT under cryogenic temperatures
S Pruvost, S Delcourt, I Telliez… - IEEE electron device …, 2005 - ieeexplore.ieee.org
In this letter, the microwave and noise performance of SiGe heterojunction bipolar transistors
(HBTs) has been characterized when cooling down the temperature. It was found that SiGe …
(HBTs) has been characterized when cooling down the temperature. It was found that SiGe …
<? Pub Dtl=""?> A New Analytical Method for Robust Extraction of the Small-Signal Equivalent Circuit for SiGe HBTs Operating at Cryogenic Temperatures
JL Olvera-Cervantes, JD Cressler… - IEEE transactions on …, 2008 - ieeexplore.ieee.org
We present a new analytical direct parameter-extraction methodology for obtaining the small-
signal equivalent circuit of HBTs. It is applied to cryogenically operated SiGe HBTs as a …
signal equivalent circuit of HBTs. It is applied to cryogenically operated SiGe HBTs as a …
[图书][B] On-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond
A Rumiantsev - 2022 - books.google.com
The increasing demand for more content, services, and security drives the development of
high-speed wireless technologies, optical communication, automotive radar, imaging and …
high-speed wireless technologies, optical communication, automotive radar, imaging and …
Verification of wafer-level calibration accuracy at cryogenic temperatures
A Rumiantsev, R Doerner… - On-Wafer Calibration …, 2022 - taylorfrancis.com
This article presents the results of accuracy verification of wafer level calibration at cryogenic
temperatures based on coplanar calibration standards. For the first time, the electrical …
temperatures based on coplanar calibration standards. For the first time, the electrical …
On-wafer high frequency noise power measurements under cryogenic conditions: a new de-embedding approach
S Delcourt, G Dambrine, NE Bourzgui… - 34th European …, 2004 - ieeexplore.ieee.org
This work consist in an accurate estimation of the available noise power of the accesses of
our cryogenic probe station in order to estimate precisely the on wafer Noise Figure or Noise …
our cryogenic probe station in order to estimate precisely the on wafer Noise Figure or Noise …