An overview of conventional and new advancements in high kappa thin film deposition techniques in metal oxide semiconductor devices

P Devaray, SFWM Hatta, YH Wong - Journal of Materials Science …, 2022 - Springer
In the last three decades, study has seen the evolution of metal oxide semiconductor (MOS)
devices as device geometries have shrunk in line with Moore's law. This device shrunk …

A review of rare-earth oxide films as high k dielectrics in MOS devices—Commemorating the 100th anniversary of the birth of Academician Guangxian Xu

S Li, Y Lin, S Tang, L Feng, X Li - Journal of Rare Earths, 2021 - Elsevier
Recently, rare-earth oxide films have attracted more and more attention as gate dielectrics in
metal-oxide-semiconductor (MOS) devices, showing the advantages of high dielectric …

Balanced Performance Improvement of a-InGaZnO Thin-Film Transistors Using ALD-Derived Al2O3-Passivated High-k HfGdOx Dielectrics

Y Zhang, Y Lin, G He, B Ge, W Liu - ACS Applied Electronic …, 2020 - ACS Publications
High-speed operation and low-power-consumption requirements have accelerated the
development of thin-film transistors (TFTs) with exploration of gate dielectrics. In this work …

[HTML][HTML] High-contrast, highly textured VO2 thin films integrated on silicon substrates using annealed Al2O3 buffer layers

M Lust, S Chen, CE Wilson, J Argo… - Journal of Applied …, 2020 - pubs.aip.org
We present vanadium dioxide (VO 2) thin films having high resistivity contrast with silicon
substrates through use of crystallized alumina (Al 2 O 3) buffer layers, engineered for this …

Solution processed low band gap ion-conducting gate dielectric for low voltage metal oxide transistor

NK Chourasia, A Sharma, V Acharya, N Pal… - Journal of Alloys and …, 2019 - Elsevier
Low band gap ion conducting Li 2 ZnO 2 thin film has been synthesized by low cost solution
processed technique and has been employed to fabricate low operating voltage metal oxide …

Surface passivation engineering approach to fluoroacrylate-incorporated polytetrafluoroethylene for highly reliable a-IGZO TFTs

F Shan, HL Zhao, XL Wang, JY Lee… - Journal of Materials …, 2022 - pubs.rsc.org
Amorphous indium gallium zinc oxide (a-IGZO) thin-film transistors (TFTs) have attracted
considerable attention for cutting-edge and next-generation electronics applications …

Enhanced memory window and efficient resistive switching in stabilized BaTiO3-based RRAM through incorporation of Al2O3 interlayer

AS Chabungbam, M Kim, A Thakre, D Kim… - Journal of Materials …, 2024 - Elsevier
As artificial intelligence and big data become increasingly prevalent, resistive random-
access memory (RRAM) has become one of the most promising alternatives for storing …

Ni doping significantly improves dielectric properties of La2O3 films

S Li, Y Lin, Y Wu, X Li, W Tian - Journal of Alloys and Compounds, 2020 - Elsevier
With rapid development of integrated circuits, a long-standing challenge is to seek new gate
dielectrics to replace HfO 2. Lanthanum oxide (La 2 O 3) has earned more and more …

Ta-doped modified Gd2O3 film for a novel high k gate dielectric

S Li, Y Wu, G Li, H Yu, K Fu, Y Wu, J Zheng… - Journal of Materials …, 2019 - Elsevier
Abstract Gadolinium oxide (Gd 2 O 3) film has potential as a candidate gate dielectric to
replace HfO 2. In this work, we provide a simple method by trace Ta (∼ 1%) doping to …

Significantly improved high k dielectric performance: rare earth oxide as a passivation layer laminated with TiO2 film

S Li, W Wang, Y Lin, L Wang, X Li - Journal of Rare Earths, 2023 - Elsevier
In order to achieve a super gate dielectric performance, rare earth oxides featuring for large
band gap, good thermodynamic stability and relatively high k value were selected to be …