We present a novel approach for synthesizing photo-realistic images of people in arbitrary
poses using generative adversarial learning. Given an input image of a person and a …

Competitive position in the semiconductor field depends on yield which is becoming more
challenging to achieve high levels due to the increasing complexity associated with the …

At advanced technology nodes, complex interactions between layout features and the
process can lead to manufacturability issues that reduce yield. Due to the huge number of …

Submitted to the Special Issue on Machine Learning for CAD (ML-CAD). Competitive
strength in semiconductor field depends on yield. The challenges associated with designing …

The benefits of the continued progress in integrated circuit manufacturing have been
numerous, most notably in the explosion of computing power in devices ranging from cell …

Test vehicles are important circuits for process yield learning at early stage. In-house
customized standard cell libraries should also be evaluated from the yield perspective. In …

Test vehicles of various types that aim to identify yield detractors are essential for maturing a
new semiconductor process before high volume production. Due to large number of …

The relentless scaling of integrated circuits (IC) are bringing challenges to the manufacturing
process. The decreasing distance between transistors and complicated layout features …

The continued scaling of integrated circuits (ICs) introduces complex interactions between
layout features, which can lead to manufacturability issues that reduce yield. In recent years …

Previous work on the Carnegie Mellon Logic Characterization Vehicle (CM-LCV) has
achieved optimal testability for static fault models. This work explores enhancements to the …