Effective Work Functions of the Elements: Database, Most probable value, Previously recommended value, Polycrystalline thermionic contrast, Change at critical …
H Kawano - Progress in surface science, 2022 - Elsevier
As a much-enriched supplement to the previous review paper entitled the “Effective work
functions for ionic and electronic emissions from mono-and polycrystalline surfaces”[Prog …
functions for ionic and electronic emissions from mono-and polycrystalline surfaces”[Prog …
Adsorbed layer and thin film growth modes monitored by Auger electron spectroscopy
C Argile, GE Rhead - Surface Science Reports, 1989 - Elsevier
Quantitative surface chemistry depends crucially on an accurate analysis of adsorbed
quantities in the range from submonolayer coverages to several monolayers. Auger electron …
quantities in the range from submonolayer coverages to several monolayers. Auger electron …
Thermionic refrigeration
GD Mahan - Journal of Applied Physics, 1994 - pubs.aip.org
Presently there are two standard methods of refrigeration: One is based on freon
compressors, and the other is based on thermoelectric phenomena. The freon compressor is …
compressors, and the other is based on thermoelectric phenomena. The freon compressor is …
Effective work functions for ionic and electronic emissions from mono-and polycrystalline surfaces
H Kawano - Progress in surface science, 2008 - Elsevier
The effective work functions (ϕ+, ϕe and ϕ−) for positive-ionic, electronic, and negative-ionic
emissions from mono-and polycrystalline surfaces are surveyed comprehensively and also …
emissions from mono-and polycrystalline surfaces are surveyed comprehensively and also …
Alkali adsorption on GaAs (110): atomic structure, electronic states and surface dipoles
F Bechstedt, M Scheffler - Surface science reports, 1993 - Elsevier
During the last six decades the theory of Schottky-barrier formation at metal/semiconductor
interfaces has been and still is a matter of scientific controversy. In order to achieve a better …
interfaces has been and still is a matter of scientific controversy. In order to achieve a better …
Photoelectron diffraction study of Si (001) 2× 1-K surface: Existence of a potassium double layer
T Abukawa, S Kono - Physical Review B, 1988 - APS
X-ray photoelectron diffraction patterns of K 2 p core levels have been measured for the Si
(001) 2× 1-K surface. From a kinematical analysis of the diffraction patterns, it is concluded …
(001) 2× 1-K surface. From a kinematical analysis of the diffraction patterns, it is concluded …
Ab initio investigation of lithium on the diamond C(100) surface
We have performed ab initio calculations to investigate the adsorption of Li onto the clean
and oxygenated diamond C (100) surface. Despite a large amount of interest in alkali-metal …
and oxygenated diamond C (100) surface. Despite a large amount of interest in alkali-metal …
Surface chemistry on semiconductors studied by molecular-beam reactive scattering
LY Ming, LA DeLouise - Surface science reports, 1994 - Elsevier
This Report reviews the use of molecular-beam reactive scattering to study the surface
reactions of gas molecules on semiconductors which have relevance to microelectronic …
reactions of gas molecules on semiconductors which have relevance to microelectronic …
Unravelling the secrets of Cs controlled secondary ion formation: Evidence of the dominance of site specific surface chemistry, alloying and ionic bonding
K Wittmaack - Surface Science Reports, 2013 - Elsevier
Exposure of ion bombarded solids to Cs gives rise to a very strong enhancement of the
yields of negatively charged secondary ions and, concurrently, to a lowering of positive ion …
yields of negatively charged secondary ions and, concurrently, to a lowering of positive ion …
MCsn+-SIMS: An innovative approach for direct compositional analysis of materials without standards
B Saha, P Chakraborty - Energy Procedia, 2013 - Elsevier
This review primarily deals with the compensation of 'matrix effect'in secondary ion mass
spectrometry (SIMS) for direct quantitative analysis of materials using MCs+-SIMS approach …
spectrometry (SIMS) for direct quantitative analysis of materials using MCs+-SIMS approach …