Near-junction thermal management: Thermal conduction in gallium nitride composite substrates

J Cho, Z Li, M Asheghi… - Annual Review of Heat …, 2015 - dl.begellhouse.com
The thermal management challenge posed by gallium nitride (GaN) high-electron-mobility
transistor (HEMT) technology has received much attention in the past decade. The peak …

Effects of Thermal Boundary Resistance on Thermal Management of Gallium-Nitride-Based Semiconductor Devices: A Review

T Zhan, M Xu, Z Cao, C Zheng, H Kurita, F Narita… - Micromachines, 2023 - mdpi.com
Wide-bandgap gallium nitride (GaN)-based semiconductors offer significant advantages
over traditional Si-based semiconductors in terms of high-power and high-frequency …

A quasi-physical compact large-signal model for AlGaN/GaN HEMTs

Z Wen, Y Xu, Y Chen, H Tao, C Ren… - IEEE Transactions …, 2017 - ieeexplore.ieee.org
This paper presents an accurate quasi-physical compact large-signal model for GaN high
electron mobility transistors (HEMTs). The drain current I ds expression is acquired by …

The impact of bias conditions on self-heating in AlGaN/GaN HEMTs

S Choi, ER Heller, D Dorsey, R Vetury… - IEEE transactions on …, 2012 - ieeexplore.ieee.org
The thermal response of AlGaN/GaN high electron mobility transistors directly correlates
with the overall performance and reliability of these devices. In general, a hot spot develops …

Nanostructures significantly enhance thermal transport across solid interfaces

E Lee, T Zhang, T Yoo, Z Guo, T Luo - ACS applied materials & …, 2016 - ACS Publications
The efficiency of thermal transport across solid interfaces presents large challenges for
modern technologies such as thermal management of electronics. In this paper, we report …

Electrothermal studies of GaN-based high electron mobility transistors with improved thermal designs

Q Hao, H Zhao, Y Xiao, MB Kronenfeld - … Journal of Heat and Mass Transfer, 2018 - Elsevier
In recent years, tremendous efforts have been dedicated to GaN high electron mobility
transistors (HEMTs) for high-power and high-frequency applications. In general, the …

[HTML][HTML] A hybrid simulation technique for electrothermal studies of two-dimensional GaN-on-SiC high electron mobility transistors

Q Hao, H Zhao, Y Xiao - Journal of Applied Physics, 2017 - pubs.aip.org
In this work, a hybrid simulation technique is introduced for the electrothermal study of a two-
dimensional GaN-on-SiC high electron mobility transistor. Detailed electron and phonon …

Experimental Study and Device Design of NO, NO2, and NH3 Gas Detection for a Wide Dynamic and Large Temperature Range Using Pt/AlGaN/GaN HEMT

C Bishop, Y Halfaya, A Soltani… - IEEE Sensors …, 2016 - ieeexplore.ieee.org
We report an AlGaN/GaN HEMT gas sensor designed to enable NO, NO 2, and NH 3
detection from 100° C-400° C over a large concentration range. Device modeling is …

Device-level thermal analysis of GaN-based electronics

KR Bagnall - 2013 - dspace.mit.edu
Gallium nitride (GaN)-based microelectronics are one of the most exciting semiconductor
technologies for high power density and high frequency electronics. The excellent electrical …

Reproducing GaN HEMT kink effect by simulating field-enhanced barrier defect ionization

M Grupen - IEEE Transactions on Electron Devices, 2019 - ieeexplore.ieee.org
The kink effect, long observed in GaN high electron mobility transistors (HEMTs), is
investigated with the Fermi kinetics transport hot electron simulation method. Fermi kinetics …