Study of corrosion behavior of a 22% Cr duplex stainless steel: Influence of nano-sized chromium nitrides and exposure temperature
Chromium nitrides may precipitate in duplex stainless steels during processing and their
influence on the corrosion behavior is of great importance for the steel performance. In this …
influence on the corrosion behavior is of great importance for the steel performance. In this …
Differentiation on crystallographic orientation dependence of hydrogen diffusion in α-Fe and γ-Fe: DFT calculation combined with SKPFM analysis
B Xing, R Gao, M Wu, H Wei, S Chi, Z Hua - Applied Surface Science, 2023 - Elsevier
The crystallographic orientation dependence of hydrogen diffusion in α-Fe and γ-Fe is
examined using first-principle calculations and the scanning Kelvin probe force microscopy …
examined using first-principle calculations and the scanning Kelvin probe force microscopy …
Study of corrosion behavior of a 2507 super duplex stainless steel: influence of quenched-in and isothermal nitrides
Precipitation of different types of chromium nitrides may occur during processing of super
duplex stainless steels, affecting the properties of the material. In this study the influence of …
duplex stainless steels, affecting the properties of the material. In this study the influence of …
Atomic-force microscopy study of self-assembled atmospheric contamination on graphene and graphite surfaces
A Temiryazev, A Frolov, M Temiryazeva - Carbon, 2019 - Elsevier
By means of high resolution atomic-force microscopy (AFM) we investigated the surface of
graphene and graphite. Our study shows that if the samples were stored in ambient …
graphene and graphite. Our study shows that if the samples were stored in ambient …
[HTML][HTML] Single-pass Kelvin force microscopy and dC/dZ measurements in the intermittent contact: applications to polymer materials
S Magonov, J Alexander - Beilstein journal of nanotechnology, 2011 - beilstein-journals.org
We demonstrate that single-pass Kelvin force microscopy (KFM) and capacitance gradient
(dC/dZ) measurements with force gradient detection of tip–sample electrostatic interactions …
(dC/dZ) measurements with force gradient detection of tip–sample electrostatic interactions …
High-bandwidth demodulation in MF-AFM: A Kalman filtering approach
MG Ruppert, DM Harcombe… - … /ASME Transactions on …, 2016 - ieeexplore.ieee.org
Emerging multifrequency atomic force microscopy (MF-AFM) methods rely on coherent
demodulation of the cantilever deflection signal at multiple frequencies. These …
demodulation of the cantilever deflection signal at multiple frequencies. These …
Microstructure influence on corrosion behavior of a Fe–Cr–V–N tool alloy studied by SEM/EDS, scanning Kelvin force microscopy and electrochemical measurement
M Sababi, S Ejnermark, J Andersson, PM Claesson… - Corrosion science, 2013 - Elsevier
Microstructure influence on corrosion behavior of an N-based tool alloy (Fe–Cr–V–N) has
been studied. Electron microscopy analysis showed two types of hard phases in the alloy …
been studied. Electron microscopy analysis showed two types of hard phases in the alloy …
From nanotechnology to nanoengineering
S Salaheldeen Elnashaie, F Danafar… - … for Chemical Engineers, 2015 - Springer
From Nanotechnology to Nanoengineering | SpringerLink Skip to main content
Advertisement SpringerLink Account Menu Find a journal Publish with us Track your …
Advertisement SpringerLink Account Menu Find a journal Publish with us Track your …
Nanoscale characterization of nanocarriers
S Mahira, RG Rayapolu, W Khan - Smart Nanocontainers, 2020 - Elsevier
Nanotechnology is increasingly receiving attention, as the small size of nanocarriers show
enhanced properties like high reactivity, strength, surface area, stability, etc. Nanoscale level …
enhanced properties like high reactivity, strength, surface area, stability, etc. Nanoscale level …
AFM-Based Characterization of Electrical Properties of Materials
J Alexander, S Belikov, S Magonov - Nanoscale Imaging: Methods and …, 2018 - Springer
Capabilities of atomic force microscopy (AFM) for characterization of local electrical
properties of materials are presented in this chapter. At the beginning the probe–sample …
properties of materials are presented in this chapter. At the beginning the probe–sample …